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Subject:
From:
Werner Engelmaier /* <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, [log in to unmask]
Date:
Tue, 19 May 2009 15:28:59 -0400
Content-Type:
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text/plain (810 lines)
 Hi Graham,
You are reading it incorrectly.


 If you compare the results in Fig. 2 with those in Figs. 3 and 4, it is clear that snap-curing underfill give better fatigue life improvements [do not ask me why, I don't know].
Werner


 

-----Original Message-----
From: [log in to unmask]
To: [log in to unmask]; [log in to unmask]
Sent: Tue, 19 May 2009 3:17 pm
Subject: RE: [TN] Underfill Pass/fail criteria






















Werner, my apologies - if I have offended it was not intended – where
meaning has not been understood the fault is mine.  Well, that and plus that
just as I think I’m understanding the intent of what you’ve written, someone
rushes into my cube and distracts me with an inane fact.



 



The one thing I’m not clear on – you seem to be saying that slow
curing resins give a better fatigue life, but that this doesn’t translate into
real-world reliability improvement?  Or am I reading it incorrectly?



 



regards, 

 - Graham Collins



 






From: [log in to unmask]
[mailto:[log in to unmask]] 

Sent: Tuesday, May 19, 2009 4:01 PM

To: [log in to unmask]; Collins, Graham (FN) @ ESI

Subject: Re: [TN] Underfill Pass/fail criteria






 






Hi Graham,

The English language is wonderfully adapt to explain things—that is why it has
displaced French as the language of diplomacy and German as the language of
technology—it is now a
 great lingua franca.

I try [nobody is perfect, as my wife reminds me all the time], but sometimes I
do not succeed in conveying the meaning properly.

What do I need to clarify, if not to say dumb down?

Werner









 









 






-----Original Message-----

From: Graham Collins <[log in to unmask]>

To: [log in to unmask]

Sent: Tue, 19 May 2009 2:31 pm

Subject: Re: [TN] Underfill Pass/fail criteria




For the rest of us, it's possible to get a copy of Werner's article at:





http://www.globalsmt.net/index.php?option=com_content&task=view&id=33&Itemid=65











Now if only I could get him to explain it to me in small words...  :-)











regards,





 - Graham Collins











-----Original Message-----





From: TechNet [mailto:[log in to unmask]] On Behalf Of Werner Engelmaier /*





Sent: Tuesday, May 19, 2009 3:18 PM





To: [log in to unmask]





Subject: Re: [TN] Underfill Pass/fail criteria

















 Hi Bev,





Clearly, the most important SJs that need to be covered are the outermost rows 





and the rows directly underneath the die outline—this later is most important 





for face-up BGAs and CSPs.





I do not know if one can write generally applicable pass/fail criteria [because, 





what else, 'It depends'].





I ave attached a column of mine on underfills [sorr
y for the rest of you for 





whom IPC strips the attachment], Engelmaier, W., “Reliability Improvement with 





Underfill,” Global SMT & Packaging, Vol. 6, No. 3, March 2006, pp. 66-67. 





Werner

















 

















 











-----Original Message-----





From: Bev Christian <[log in to unmask]>





To: [log in to unmask]





Sent: Tue, 19 May 2009 1:51 pm





Subject: [TN] Underfill Pass/fail criteria

































































TechNetters,





I am aware of J-STd-030 "Guideline for Selection & Application of





Underfill" and the existence of IPC standards committee 5-24F "Underfill





Adhesives for Flip Chip Applications".  There is nothing in IPC-A-610D





about underfills.  I have taken Brian Toleno's very good course on





underfills, but on going back and looking at the CD, I don't see





anything on pass/fail criteria.  Do any of you know of an international





standard (American, IEC, Japanese) with pass/fail criteria for cured





unde

rfills?











I am particularly interested in what said standard (or anything you want





to tell me) says about coverage and voiding.











Bev





RIM











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