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May 2009

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Subject:
From:
Werner Engelmaier /* <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, [log in to unmask]
Date:
Tue, 19 May 2009 15:07:46 -0400
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 Bev,
You missed the biggest disadvantage—it is destructive.
I would think the completeness of underfill coverage depends at least to some degree on the degree of the quality of the flux removal process underneath the component. Thus, I would think you will find something different with each component. 
Having a destructive method may give you 100% scrap, 8-(
Werner


 


 

-----Original Message-----
From: Bev Christian <[log in to unmask]>
To: [log in to unmask]
Sent: Tue, 19 May 2009 2:54 pm
Subject: Re: [TN] Underfill Pass/fail criteria










Ioan,

Well if you don't have any expletive deleted RF cans in the way, you can use 
acoustic microscopy.  Otherwise your choices are:

1) Prying

2) Vertical cross-sectioning

3) Horizontal cross-sectioning

 

Here blow are my perceived advantages and disadvantages of each. I pasted the 
table in as HTML.  Hope this shows up in TechNet!

 

Method

Advantages

Disadvantages

Prying

Fast, easy, can be done by anyone, checks whole area under component at once

Misses embedded voids that don't reach the underfill/component interface

Vertical Cross-sectioning

Finds buried voids

Requires lab staff, only finds voids in the particular plane sectioned, unless 
grind further (very time consuming)

Horizontal cross-sectioning

Finds buried voids, checks whole area under component

Requires lab staff, very time consuming

 

Bev

RIM

-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Ioan Tempea
Sent: Tuesday,20May 19, 2009 2:40 PM
To: [log in to unmask]
Subject: Re: [TN] Underfill Pass/fail criteria

 

Bev,

 

No answer here, but one question: how can one visualize and measure voiding in 
underfills?

 

Thanks,

 

Ioan Tempea, ing.

t : 450-967-7100 ext : 244

[log in to unmask]

www.digico.cc

P N'imprimer que si nécessaire - Print only if you must

-----Message d'origine-----

De : Bev Christian [mailto:[log in to unmask]] 

Envoyé : 19 mai 2009 13:52

À : [log in to unmask]

Objet : [TN] Underfill Pass/fail criteria

 

TechNetters,

I am aware of J-STd-030 "Guideline for Selection & Application of

Underfill" and the existence of IPC standards committee 5-24F "Underfill

Adhesives for Flip Chip Applications".  There is nothing in IPC-A-610D

about underfills.  I have taken Brian Toleno's very good course on

underfills, but on going back and looking at the CD, I don't see

anything on pass/fail criteria.  Do any of you know of an international

standard (American, IEC, Japanese) with pass/fail criteria for cured

underfills?

 

I am particularly interested in what said standard (or anything you want

to tell me) says about coverage and voiding.

 

Bev

RIM

 

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