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Subject:
From:
"Wenger, George M." <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Wenger, George M.
Date:
Fri, 16 Jan 2009 15:39:23 -0500
Content-Type:
text/plain
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text/plain (262 lines)
Lots of the things you and others have said about Tan G
Richard,



Lots of the things you and others have said about Tan Geok's failures

may be correct but I think they are all speculations based on what we

think the images show.  However, I'm not sure the quality of the cross

section is good enough to see the signature of the failure.  My

suggestion to Tan Geok would be to have the lab re-polish and microetch

the cross section and take good quality color photomicrographs.



Regards,

George

George M. Wenger

Andrew Wireless Solutions

Senior Principal FMA / Reliability Engineer

40 Technology Drive, Warren, NJ 07059

(908) 546-4531 [Office]  (732) 309-8964 [Cell]

[log in to unmask]

 

-----Original Message-----

From: TechNet [mailto:[log in to unmask]] On Behalf Of Stadem, Richard D.

Sent: Friday, January 16, 2009 10:48 AM

To: [log in to unmask]

Subject: Re: [TN] Possible cause on open



I expanded the images and I am sending them back to Steve for

re-posting. I can see a lot of flower-petal patterns, a lot of rod and

cone structures just above the IMC. It appears as if there are very

heavy gold intermetallics along the top of the IMC, and the gold

nucleated back towards the IMC from the solder ball. The IMC layer is

very thin. 

The solder between the edge of the soldermask and the edge of the pad

causes the pad edge to look like they curled at the edges, but I think

you can see that it is just the crack curling downwards inside of the

solder. Full reflow obviously took place because the solder melted down

the sides of the pads and filled the space between the soldermask and

the curled edges of the pad. In the image taken near the center of the

pad, it is obvious the crack propogated through the solder in some

areas.

The crack along the entire length of the pad and down the sides

indicates severe stresses due to either the vibration forces or the CTE

from the temperature cycling, or both. The crack probably formed due to

the brittle nature of the IMF, what with having the worst possible

combination of ENIG, lead-free solder, and lateral stresses. There are

some voids with flux debris above the whole thing that tend to confuse

the issues going on.

Steve, I am sending my expanded image to you for posting separately.

Thanks.

Richard



-----Original Message-----

From: TechNet [mailto:[log in to unmask]] On Behalf Of Igoshev, Vladimir

Sent: Thursday, January 15, 2009 8:42 PM

To: [log in to unmask]

Subject: Re: [TN] Possible cause on open



Thank you for sending me the image. Honestly, I don't quite understand

what I see. The finish doesn't look like ENIG and the cavity above

something that DOES NOT look like a typical intermetallic shouldn't be

there, not to mention a "hair-like" something (crack?????) above the

cavity.



It looks like a proper joint had never been formed. Can you ask the lab

to slightly etch the section?



Regards,



Vladimir



________________________________



From: Tan Geok Ang

To: Igoshev, Vladimir; [log in to unmask]

Sent: Thu Jan 15 20:09:33 2009

Subject: RE: [TN] Possible cause on open 





About 1.05um



 



________________________________



From: Igoshev, Vladimir [mailto:[log in to unmask]]

Sent: Friday, 16 January 2009 9:01 AM

To: Tan Geok Ang; [log in to unmask]

Subject: Re: [TN] Possible cause on open



 



The info I'm asking about is at the bottom of the images you sent to

Steve. You should be able to read from the originals what it says (how

many microns)



Regards,



Vladimir



----- Original Message -----

From: Tan Geok Ang <[log in to unmask]>

To: TechNet E-Mail Forum <[log in to unmask]>; Igoshev, Vladimir

Sent: Thu Jan 15 19:53:13 2009

Subject: RE: [TN] Possible cause on open



The service lab has not come out much information at this time. Will

input you once I have the information. Thank you.



-----Original Message-----

From: TechNet [mailto:[log in to unmask]] On Behalf Of Igoshev, Vladimir

Sent: Thursday, 15 January 2009 10:50 PM

To: [log in to unmask]

Subject: Re: [TN] Possible cause on open



It looks like there could be something fishy in the intermetallic layer.

GA, can you tell me please what is the reading on the micron bars?



Regards,



Vladimir



-----Original Message-----

From: TechNet [mailto:[log in to unmask]] On Behalf Of Steve Gregory

Sent: Thursday, January 15, 2009 8:05 AM

To: [log in to unmask]

Subject: Re: [TN] Possible cause on open



Mornin' Everbody!



Well, here in Tulsa, we're just like a lot of other people in the

country this morning, trying to stay warm. Right now we're sitting at

-10 C. with a wind chill of -15 C. It's supposed to be colder

tomorrow...



GA, I have your pictures posted now. They're at:



http://stevezeva.homestead.com/files/Fracture1.jpg



http://stevezeva.homestead.com/files/Fracture2.jpg



Hopefully someone can give you some ideas...



Steve





________________________________



From: Tan Geok Ang [mailto:[log in to unmask]]

Sent: Wednesday, January 14, 2009 7:27 PM

To: [log in to unmask]; Steve Gregory

Subject: Possible cause on open







Hi Steve,



            Please help to download these pictures TechNet, thanks.



    











Hi All experts,



            Testing (combine test of 16G at 85 oC) was performed on

evaluation boards with under-filled BGAs. Open issue (cracks) was

detected only at some corners of the BGA (35x35mm with 1156 balls) after

the test. Lead-free process and PCB with ENIG surface finish. Peak

temperature is 248 oC with a 65 sec above 217 oC.



FYI, the service lab has not come out a report.



            What are the possible causes? (CET mismatches, Lead-free

alloy related, material, processes)







            Thank you in advance.







Regards



GA Tan



 





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