The EMPF Camp had a DOE for stencil printing. Measuring solder paste
deposits was a problem.
There are better tools now.
Cpk is a problem when your process output is measured with attributes data.
There is a nice discussion of this in Statistical Process Control for
Surface Mount Technology by William Messina.
-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of john queen
Sent: Tuesday, October 28, 2008 6:55 AM
To: [log in to unmask]
Subject: [TN] CPK
Guys I am trying to make up some tools for measuring cpk of Reflow oven
profiles, I am also trying to put together a DOE for screen printing. I was
hoping you can all point me in the right direction or if any of you have
done anything like this before.
Many Thanks
John
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