Ni hao GA Tan,
The preferred failure definitiion is
a) Event detector, 1000 ohms, 10 events (maximum), 1 micro-second duration
(maximum), report first verified as time-to-failure.
It is better yet to use:
Event detector, 300 ohms, 10 events (maximum), 1 micro-second duration
(maximum), report first verified as time-to-failure [I take it 1msec is a typo].
b) gives you somewhat later failure indication, depending on what it is you
are testing.
It is considered a failure with 5 scans more than 20% resistance increase
over the initial nominal resisistance at the same temperature.
Regards,
Werner Engelmaier
可靠性先生
Engelmaier Associates, L.C.
Electronic Packaging, Interconnection and Reliability Consulting
7 Jasmine Run
Ormond Beach, FL 32174 USA
Phone: 386-437-8747, Cell: 386-316-5904
E-mail: [log in to unmask], Website: www.engelmaier.com
**************
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