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Fri, 18 Apr 2008 13:53:36 EDT
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As perhaps the only person still around that attended the meetings   
resulting 
in the equivalence factors and IPC Cleaning & Contamination  Chair  at that 
time, perhaps a few points would facilitate the  discussion:

1. The Navy set up the ionic testing development program to  solve a serious  
failure problem in S.E. Asia. 
It worked.

2.  In the timeframe when the test was developed and put in place by the   
military, most of the rest of the electronics industry in the US used the  
mil  
specs since they were free.

3. As the IPC set up and  adopted Classes 1-3 (basically toys up to  
military/high rel), I asked  the committee if we used the mil test result for 
 Class 3, 
could we use  1.5x that limit for Class 2 and 2-3x for Class 1? 
The response was that with  proper cleaning, the mil limit could readily be  
achieved while serving  to monitor daily production. So the industry 
continued 
to  use the  (free) mil spec test standard.

4. The ionic contamination test was a  valuable monitoring tool, since  the 
SIR tests were done on coupons,  not on actual assemblies, and took 1-2 weeks 
 to 
complete. Needless to  say, a high volume electronics producer could turn out 
 
a significant  volume of PWAs during that time, often shipping them into the  
field as  soon as assembly was completed.

5. As noted in my SMT column (offered  yesterday) T. O.  Duyck of Northern 
Telecom was charged with  implementing water soluble flux for  NT electronics 
production. During  that time he observed and reported the  differences in 
flux 
residue  release rates, pointing out that rosin ca 90% of  rosin flux 
residues  
release from the PWA surface during the 10-15 test time for  ionic test  
equipment, while water soluble flux residues may take up to 2 hrs. to   
achieve the same 
level of release. Thus the release rate should be checked  to  ensure the 
flux 
used, time test time and the instrument employed  provide  reliable results 
and guidance to the production engineer. 
(See T. O. Duyck and M. Boulos, "Water Washes  Reliability into Telephone 
Circuit Packs", IPC-TR-206, April, 1978)
Based on this work, I investigated the release rate of  SA flux residues, 
finding it even faster than rosin fluxes. (See W. G. Kenyon,  "Synthetic 
Activated (SA) Flux Technology: Development, Commercialization,  Benefits and Future 
Applications", Internepcon Japan, 24 Jan.  1986)

6. In the late 1980's, the materials and acceptance of the  no clean or low  
residue or acceptable dirt concept became widely  accepted and implemented on 
the  designs of the time. Outsourcing to  contract assemblers (both in the US 
and 
overseas) became widely practiced,  so much of the former 'in-house' cleaning 
expertise disappeared. 

7.  This was seen at IPC as the number of company sponsored volunteers   
dwindled. Could we take on projects today to develop an updated ionic test  
for  pr
ocess monitoring? Find enough participants to conduct  statistically sound  
round 
robin testing?  

Bill   Kenyon
Global Centre Consulting
3336 Birmingham Drive
Fort Collins,  CO  80526
Tel: 970.207.9586   Cell:   970.980.6373




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