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April 2008

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Subject:
From:
"Stadem, Richard D." <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Stadem, Richard D.
Date:
Tue, 22 Apr 2008 11:25:49 -0500
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Was the crystal open, exhibiting wrong frequency, shorted, or what? Was
there any test analysis/troubleshooting data?
We need that in order to hazard a guess as to how the rework may have
affected the part or suggest a failure analysis strategy. 

-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Leland Woodall
Sent: Tuesday, April 22, 2008 10:16 AM
To: [log in to unmask]
Subject: [TN] Crystal Damage Question

Technetters,

We recently had a Murata SMD crystal to cause a failure in the field.
This particular unit had been to Repair and the component was manually
replaced during the manufacturing process.

The vendor analysis reported the component saw excessive heat during the
rework and caused internal depolarization which led to failure.

We made 10 attempts to re-create this condition and were unsuccessful in
doing so.  We used dual soldering irons, had the temps cranked as far as
they would go, and gave them excessive exposure times.

Could the vendor analysis have been incorrect, or was their explanation
a real possibility?

Why were we not able to replicate this?

Thanks in advance,

Leland

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