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TechNet E-Mail Forum <[log in to unmask]>, Hfjord <[log in to unmask]>
Date:
Fri, 21 Mar 2008 18:40:05 +0100
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Hi folks, do you have Bunni's papers on Black Pads, hyperactive IG und so
weiter? Very good research made by him. He enlighted many of us years ago
with these pages. If someone wants it, I can send to Steve Gregory for all
to download.
/Inge

-----Ursprungligt meddelande-----
Från: TechNet [mailto:[log in to unmask]] För David D. Hillman
Skickat: den 21 mars 2008 16:37
Till: [log in to unmask]
Ämne: Re: [TN] Case of the popping BGAs

Hi folks! Another very good reference to read on black pad is:

"The Root Cause of Black Pad Failure of Solder Joints with ENIG", Journal 
of Metals, June 2006, authors Zeng/Stierman/Abbot/Murtuza

Also, where did the term "gray pad" come from? If someone starts using the 
term "mauve" or "plaid" we going have to have a serious IPC-T-50 
discussion!

Dave Hillman
Rockwell Collins
[log in to unmask]




"Igoshev, Vladimir" <[log in to unmask]> 
Sent by: TechNet <[log in to unmask]>
03/19/2008 04:10 PM
Please respond to
TechNet E-Mail Forum <[log in to unmask]>; Please respond to
"Igoshev, Vladimir" <[log in to unmask]>


To
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Subject
Re: [TN] Case of the popping BGAs






Hi George,

There is a very nice ATOTECH paper published a few years back which is
called "Black Pad vs. Brittle Fracture". The major difference in the
appearance between the two modes is the presence of cavitaion in the
layer of electroless Ni (in X-section) in case of BP.

Regards,

Vladimir

-----Original Message-----
From: Wenger, George M. [mailto:[log in to unmask]] 
Sent: Wednesday, March 19, 2008 4:56 PM
To: TechNet E-Mail Forum; Igoshev, Vladimir
Subject: RE: [TN] Case of the popping BGAs

Vladimir,

Maybe I've missed something.   Is there an accepted definition for a
"Black Pad" failure?

Regards,
George
George M. Wenger
Andrew Wireless Solutions
Senior Principal FMA / Reliability Engineer
40 Technology Drive, Warren, NJ 07059
(908) 546-4531 [Office]  (732) 309-8964 [Cell]
[log in to unmask]
 

-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Igoshev, Vladimir
Sent: Wednesday, March 19, 2008 4:48 PM
To: [log in to unmask]
Subject: Re: [TN] Case of the popping BGAs

George,

If you take a look at a typical case of Brittle Fracture (which has
nothing to do with BP), then you also will see a pad with a  shade of
black and mud cracking.

Regards,

Vladimir

-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Wenger, George M.
Sent: Wednesday, March 19, 2008 4:39 PM
To: [log in to unmask]
Subject: Re: [TN] Case of the popping BGAs

Without trying to be too sarcastic, the easiest way I know 
Tom,

Without trying to be too sarcastic, the easiest way I know to find out
if Werner is correct is look at the pad and see if it is black or dark
gray in color.  I've said this many times, in my way of thinking "Black
Pad" isn't a name that describes a failure mechanism, it's a name that
describes what you see after the failure occurs.  The results you
described are typical of analytical labs.  They have lots of analytical
data to try an impress the customer that they got their money's worth
but they don't state what might be obvious.  I think from the analysis
the Ni on the pads is probably a sure give away that the surface finish
on the PCBA was probably ENIG.  There wasn't an analysis of what was on
the BGA side of the failure but my guess is when the BGA's fell off the
solder balls stayed attached to the BGA and the IMC was probably thicker
on the BGA side of the fracture than the pad side which would indicate
that your fractures were close to or at the electroless nickel / IMC
interface.  Like I indicated if the pads look back or dark gray in color
you probably have a "classic" case of "Black Pad".  If the pads are not
black and you don't see the "mud cracking" also said to be an indication
of "Black Pad" then you probably still have a stress induced brittle
ENIG fracture at or near the electroless nickel / IMC interface. 

Regards,
George
George M. Wenger
Andrew Wireless Solutions
Senior Principal FMA / Reliability Engineer
40 Technology Drive, Warren, NJ 07059
(908) 546-4531 [Office]  (732) 309-8964 [Cell]
[log in to unmask]
 

-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Igoshev, Vladimir
Sent: Wednesday, March 19, 2008 3:43 PM
To: [log in to unmask]
Subject: Re: [TN] Case of the popping BGAs

Hi Tom,

Unlike Werner, I wouldn't "blame" Black Pad right away  :-) Is it
possible to see cross-sectional images of the joints? 

Regards,

Vladimir

-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Gervascio, Thomas
Sent: Wednesday, March 19, 2008 3:08 PM
To: [log in to unmask]
Subject: [TN] Case of the popping BGAs

Want to ask the advice of the Learned Forum members. Had an experience
where BGAs were falling off CCAs after shipment. Both the solder and the
solder balls are Sn63/Pb 37 solder alloy.  Had the parts and boards
tested by a third party lab. Their results are 
 
"The following report is in regards to the failure analysis of the two
largest BGA components on failed
assembly . The following lists the analyses performed in the attempt to
determine the root cause of the separation of the BGA components from
the assembly: 
 

- SEM/EDS surface analysis of the failed PCB sites 

-SEM/EDS surface analysis of the corresponding failed BGA component
sites 

-Micro-sectional/SEM evaluation of the failed PCB sites 

-Micro-sectional/SEM evaluation of the corresponding failed BGA
component sites 

All evaluations were performed with a Camscan MV2300 thermionic emission
scanning electron microscope (SEM), fitted with an Oxford EDS system
(elementalanalysis). The images obtained during the analysis can be
found in the following pages. 
 
Note: All micro-section samples were exposed to a chemical tin and
copper etch, to better visualize 
the intermetallic layer (IMC). 
 
Results: 
 
SEM/EDS surface analysis 
The following tables show the EDS results (in weight%) of five randomly
chosen sites on the failed PCB and failed component site respectively.
All analysis was obtained at 10kV acceleration potential 
(ND = Not Detected): 
 
PCB site/small BGA 
 
Pad     Ni     Sn     P      C     O 
1        74.5   3.9    6.6   13.8  1.2 
2       75.7    3.7    6.9   12.7  1.0 
3       78.8    4.0    7.3   9.9    ND 
4        77.7    4.1   6.8   11.4   ND 
5        81.1   3.6    7.9   7.5    ND 
 
PCB site/large BGA 
 
Pad    Ni     Sn      P      C          O 
1      80      3 .2     4 .7   11.3     0.9 
2      81.1    2.4      5.3    11.3     ND 
3       72      4.3      6.7     15.9     1.1 
4     77.5     4.9      7.4     10.3      ND 
5      78       5.5      7.5      8.9      ND 
 

Component site/small BGA 
 
Pad     Ni         Sn         Pb         C      O           P 
1         42.9     24.        8.1        23.6     7.1       0.6 
2         25.1     23         5.1         32.7     13.7     0.3 
3         42.8     26         2.4        22.4     5.9     0.5 
4         49.8     28.3     1.5         16.5     3.3     0.6 
5         35.5     20.7     1.4         31.1    10.8     0.5 
 
Component site/large BGA 
 
Pad         Ni         Sn     Pb         C         O         P 
1             42.3     27.3     1.7     23.2     5.0        0.4 
2             37.9     23.3     1.3     28.6     8.3         0.6 
3             40.7     26.4     1.8     25.2     5.4         0.5 
4             47.4     29.2     2.4     16       4.3         0.6 
5             38.7     25.3     2.8     24.7     8.4         0.2
 
 
Small BGA: 

PCB site; very thin areas of IMC were detected, but too thin to measure.
Nickel thickness was measured to be approximately 133 micro-inches. No
signs of nickel corrosion were detected. 

Component site; an average of 2.09um of IMC layer thickness was measured
on a total of three BGA solder balls evaluated. All solder balls showed
proper ball collapse and IMC formation, indicating a sufficiently hot
assembly reflow profile. 

Large BGA: 

PCB site; very thin areas of IMC were detected, but too thin to measure.
No signs of nickel corrosion were detected. 

Component site; an average of 1.52um of IMC layer thickness was measured
on a total of three BGA solder balls evaluated. All solder balls showed
proper ball collapse and IMC formation, indicating a sufficiently hot
assembly reflow profile.
 ,
 
 
What levels of Phosphorus would be expected in a nickel plating that
exhibits Black Pad? Any other ideas relating to the failure mechanism
and methods to validate them?
 
Thanks
 
Tom 

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