TECHNET Archives

March 2008

TechNet@IPC.ORG

Options: Use Monospaced Font
Show Text Part by Default
Show All Mail Headers

Message: [<< First] [< Prev] [Next >] [Last >>]
Topic: [<< First] [< Prev] [Next >] [Last >>]
Author: [<< First] [< Prev] [Next >] [Last >>]

Print Reply
Subject:
From:
"Wenger, George M." <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Wenger, George M.
Date:
Wed, 19 Mar 2008 16:38:44 -0400
Content-Type:
text/plain
Parts/Attachments:
text/plain (216 lines)
Without trying to be too sarcastic, the easiest way I know 
Tom,



Without trying to be too sarcastic, the easiest way I know to find out

if Werner is correct is look at the pad and see if it is black or dark

gray in color.  I've said this many times, in my way of thinking "Black

Pad" isn't a name that describes a failure mechanism, it's a name that

describes what you see after the failure occurs.  The results you

described are typical of analytical labs.  They have lots of analytical

data to try an impress the customer that they got their money's worth

but they don't state what might be obvious.  I think from the analysis

the Ni on the pads is probably a sure give away that the surface finish

on the PCBA was probably ENIG.  There wasn't an analysis of what was on

the BGA side of the failure but my guess is when the BGA's fell off the

solder balls stayed attached to the BGA and the IMC was probably thicker

on the BGA side of the fracture than the pad side which would indicate

that your fractures were close to or at the electroless nickel / IMC

interface.  Like I indicated if the pads look back or dark gray in color

you probably have a "classic" case of "Black Pad".  If the pads are not

black and you don't see the "mud cracking" also said to be an indication

of "Black Pad" then you probably still have a stress induced brittle

ENIG fracture at or near the electroless nickel / IMC interface. 



Regards,

George

George M. Wenger

Andrew Wireless Solutions

Senior Principal FMA / Reliability Engineer

40 Technology Drive, Warren, NJ 07059

(908) 546-4531 [Office]  (732) 309-8964 [Cell]

[log in to unmask]

 



-----Original Message-----

From: TechNet [mailto:[log in to unmask]] On Behalf Of Igoshev, Vladimir

Sent: Wednesday, March 19, 2008 3:43 PM

To: [log in to unmask]

Subject: Re: [TN] Case of the popping BGAs



Hi Tom,



Unlike Werner, I wouldn't "blame" Black Pad right away  :-) Is it

possible to see cross-sectional images of the joints? 



Regards,



Vladimir



-----Original Message-----

From: TechNet [mailto:[log in to unmask]] On Behalf Of Gervascio, Thomas

Sent: Wednesday, March 19, 2008 3:08 PM

To: [log in to unmask]

Subject: [TN] Case of the popping BGAs



Want to ask the advice of the Learned Forum members. Had an experience

where BGAs were falling off CCAs after shipment. Both the solder and the

solder balls are Sn63/Pb 37 solder alloy.  Had the parts and boards

tested by a third party lab. Their results are 

 

"The following report is in regards to the failure analysis of the two

largest BGA components on failed

assembly . The following lists the analyses performed in the attempt to

determine the root cause of the separation of the BGA components from

the assembly: 

 



- SEM/EDS surface analysis of the failed PCB sites 



-SEM/EDS surface analysis of the corresponding failed BGA component

sites 



-Micro-sectional/SEM evaluation of the failed PCB sites 



-Micro-sectional/SEM evaluation of the corresponding failed BGA

component sites 



All evaluations were performed with a Camscan MV2300 thermionic emission

scanning electron microscope (SEM), fitted with an Oxford EDS system

(elementalanalysis). The images obtained during the analysis can be

found in the following pages. 

 

Note: All micro-section samples were exposed to a chemical tin and

copper etch, to better visualize 

the intermetallic layer (IMC). 

 

Results: 

 

SEM/EDS surface analysis 

The following tables show the EDS results (in weight%) of five randomly

chosen sites on the failed PCB and failed component site respectively.

All analysis was obtained at 10kV acceleration potential 

(ND = Not Detected): 

 

PCB site/small BGA 

 

Pad     Ni     Sn     P      C     O 

1        74.5   3.9    6.6   13.8  1.2 

2       75.7    3.7    6.9   12.7  1.0 

3       78.8    4.0    7.3   9.9    ND 

4        77.7    4.1   6.8   11.4   ND 

5        81.1   3.6    7.9   7.5    ND 

 

PCB site/large BGA 

 

Pad    Ni     Sn      P      C          O 

1      80      3 .2     4 .7   11.3     0.9 

2      81.1    2.4      5.3    11.3     ND 

3       72      4.3      6.7     15.9     1.1 

4     77.5     4.9      7.4     10.3      ND 

5      78       5.5      7.5      8.9      ND 

 



Component site/small BGA 

 

Pad     Ni         Sn         Pb         C      O           P 

1         42.9     24.        8.1        23.6     7.1       0.6 

2         25.1     23         5.1         32.7     13.7     0.3 

3         42.8     26         2.4        22.4     5.9     0.5 

4         49.8     28.3     1.5         16.5     3.3     0.6 

5         35.5     20.7     1.4         31.1    10.8     0.5 

 

Component site/large BGA 

 

Pad         Ni         Sn     Pb         C         O         P 

1             42.3     27.3     1.7     23.2     5.0        0.4 

2             37.9     23.3     1.3     28.6     8.3         0.6 

3             40.7     26.4     1.8     25.2     5.4         0.5 

4             47.4     29.2     2.4     16       4.3         0.6 

5             38.7     25.3     2.8     24.7     8.4         0.2

 

 

Small BGA: 



PCB site; very thin areas of IMC were detected, but too thin to measure.

Nickel thickness was measured to be approximately 133 micro-inches. No

signs of nickel corrosion were detected. 



Component site; an average of 2.09um of IMC layer thickness was measured

on a total of three BGA solder balls evaluated. All solder balls showed

proper ball collapse and IMC formation, indicating a sufficiently hot

assembly reflow profile. 



Large BGA: 



PCB site; very thin areas of IMC were detected, but too thin to measure.

No signs of nickel corrosion were detected. 



Component site; an average of 1.52um of IMC layer thickness was measured

on a total of three BGA solder balls evaluated. All solder balls showed

proper ball collapse and IMC formation, indicating a sufficiently hot

assembly reflow profile.

 ,

 

 

What levels of Phosphorus would be expected in a nickel plating that

exhibits Black Pad? Any other ideas relating to the failure mechanism

and methods to validate them?

 

Thanks

 

Tom  



---------------------------------------------------

Technet Mail List provided as a service by IPC using LISTSERV 15.0

To unsubscribe, send a message to [log in to unmask] with following text

in

the BODY (NOT the subject field): SIGNOFF Technet

To temporarily halt or (re-start) delivery of Technet send e-mail to

[log in to unmask]: SET Technet NOMAIL or (MAIL)

To receive ONE mailing per day of all the posts: send e-mail to

[log in to unmask]: SET Technet Digest

Search the archives of previous posts at:

http://listserv.ipc.org/archives

Please visit IPC web site

http://www.ipc.org/contentpage.asp?Pageid=4.3.16 for additional

information, or contact Keach Sasamori at [log in to unmask] or 847-615-7100

ext.2815

-----------------------------------------------------



---------------------------------------------------

Technet Mail List provided as a service by IPC using LISTSERV 15.0

To unsubscribe, send a message to [log in to unmask] with following text

in

the BODY (NOT the subject field): SIGNOFF Technet

To temporarily halt or (re-start) delivery of Technet send e-mail to

[log in to unmask]: SET Technet NOMAIL or (MAIL)

To receive ONE mailing per day of all the posts: send e-mail to

[log in to unmask]: SET Technet Digest

Search the archives of previous posts at:

http://listserv.ipc.org/archives

Please visit IPC web site

http://www.ipc.org/contentpage.asp?Pageid=4.3.16 for additional

information, or contact Keach Sasamori at [log in to unmask] or 847-615-7100

ext.2815

-----------------------------------------------------



------------------------------------------------------------------------------------------------

This message is for the designated recipient only and may

contain privileged, proprietary, or otherwise private information.  

If you have received it in error, please notify the sender

immediately and delete the original.  Any unauthorized use of

this email is prohibited.

------------------------------------------------------------------------------------------------

[mf2]



---------------------------------------------------
Technet Mail List provided as a service by IPC using LISTSERV 15.0
To unsubscribe, send a message to [log in to unmask] with following text in
the BODY (NOT the subject field): SIGNOFF Technet
To temporarily halt or (re-start) delivery of Technet send e-mail to [log in to unmask]: SET Technet NOMAIL or (MAIL)
To receive ONE mailing per day of all the posts: send e-mail to [log in to unmask]: SET Technet Digest
Search the archives of previous posts at: http://listserv.ipc.org/archives
Please visit IPC web site http://www.ipc.org/contentpage.asp?Pageid=4.3.16 for additional information, or contact Keach Sasamori at [log in to unmask] or 847-615-7100 ext.2815
-----------------------------------------------------

ATOM RSS1 RSS2