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February 2008

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Subject:
From:
Werner Engelmaier /* <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, [log in to unmask]
Date:
Wed, 13 Feb 2008 19:24:19 EST
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Hi Peer,
These results, as many others, show that the accelerated test results are 
comarable [Peer, what were the dwell times at the T-extremes?]. However, that 
does not mean that functional relaibility would be of equalproportionality. 
Because SnPb solder creeps much faster, the cyclic creep process is more complete 
and more creep strain has occurred for SnPb under identical conditions. 
However, this is really comparing apples and oranges.
In real product, the cyclic dwell times are typically long enough for 
essentially complete creep at least at the high T for either SnPb or SAC; so the 
slower creep rates for the Pb-free solders do not prodect the SJs.
However, absent accelerated reliability models for Pb-free solders, the 
accelerated test results cannot be extrapolated to product conditions as yet.

Werner



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