Yes, but use of a low frequency [20-50Mhz] transducer [if the Acoustic
Microscope is so equipped/capable] in reflected mode gives much greater
penetration [and yes - with correspondingly less resolution].  

You are absolutely correct, in the real world ground planes, chips, and
traces get in the way a lot.  Ditto for through transmission - stuff
frequently gets in the way.

Witness pieces and dummy test chips make set-up and process development
so much easier.

Steve

-----Original Message-----
From: Daniel Blass [mailto:[log in to unmask]] 
Sent: Thursday, November 01, 2007 9:44 AM
To: [log in to unmask]; Creswick, Steven
Subject: Re: verifying BGA underfill coverage

The problem with C-SAM for BGA underfill is that the sound has to pass
through many layers to get to the underfill. At each interface, some
sound
passes through and some is reflected back. If the BGA has a laminate
chip
carrier, the sound has to go through all the glass fiber bundles. You
are
limited in how deep you can penetrate and the farther you penetrate, the
smallest flaw you can find will get bigger. So depending on you package
design, it may be easy or difficult. Thru-scan may be better at this
than
reflective but I don't have any experience with thru-scan. With
thru-scan,
the sound passes all the way through and is picked up on the other side
of
the PCB.

Similar to the glass slide experiments, we make our own components and
use
them for a wide range of testing. We start with a 16 mil thick board
with
arrays of pads on one side. It has no Cu planes so you can sort of see
through it. We print flux on the pads and use a version of DEK's solder
sphere printing process to place the spheres with stencil printer. After
reflow, clean, and singulation, I attach to a PCB and underfill. I can
see
the flow through ball array and big voids. After cure, I flat-section to
see
the smaller defects.

Daniel Blass
Process Research Engineer with the Area Array Consortium
Advanced Process Laboratory at Unovis Solutions


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