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October 2007

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Subject:
From:
Alexandra Curtis <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Alexandra Curtis <[log in to unmask]>
Date:
Tue, 16 Oct 2007 15:56:23 -0500
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IPC Test and Inspection Conference: The Changing World of Test Protocols
- Reducing Time to Market
December 10-12, 2007 - San Jose, CA

IPC announces a new technical conference including workshops, technical
presentations, latest equipment offerings and site visits, all dedicated
to the changing world of test and inspection protocols. 

Attending the IPC Test and Inspection Conference: The Changing World of
Test Protocols will allow you to examine the methods and practices
currently used to validate the performance capability of electronic
equipment. The stage will be set to explore alternatives, consider cost
implications, and incorporate all associated technologies for test and
inspection.

Early Registration - Register by November 5, 2007, and save an
additional 10% off of the current registration prices or a group
discount, register three individuals from your company at the same time
and receive the fourth registration FREE. Note: The discount will apply
to the lowest-cost registration. For more information or to register,
please cut and paste www.ipc.org/test conf into your browser and
download the registration form.

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