I am trying to decipher a test log from a Teradyne Test Station ICT
tester from our CM.  The file has lines with what appears to be "Ref
Des" = "Measured Value" ("Upper limit"," Lower Limit") "Prefix.  The
prefix is either R, AR, RP,CP, CS, V etc. I am guessing it is the
parameter being measured.

 

There are some components measured twice for example:

R12#200.304937K(,)R 

R12=200.304937K(190K,210K)AR

And:

C13=103.633338P(,)CP

C13=95.413011P(68.000008P,101.999985P)AR

 

I assume this is some technique used to detect the presence and or
proper value of the component as it appears in circuit, since C13 is
across two IC pins and has another series L - C across it.  I guess the
biggest question is what is AR?  I am guessing CS is series capacitance
and CP is parallel capacitance, but I can't be sure.  Does anyone have
any documentation (app notes, user manuals, etc) they could point me to
that would explain the measurement techniques used to measure passive
components in loaded PCB assemblies?  Something specific to how the
Teradyne/Genrad Test Station Testers do things would be most helpful.

 

Jim Verrette

Electrical Engineer

 

 


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