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September 2007

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Subject:
From:
Michael F Greaves <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Michael F Greaves <[log in to unmask]>
Date:
Thu, 13 Sep 2007 11:11:08 -0400
Content-Type:
text/plain
Parts/Attachments:
text/plain (37 lines)
On 2007-09-13 08:01, Stadem, Richard D. wrote:
> Technet strips attachments.

Thanks everyone.  I was surprised to find an attachment
facility there on the post-message page.

I've just had them put on a web server:

http://tumladen.net/pcb/pic00041.jpg
http://tumladen.net/pcb/pic06334.jpg
http://tumladen.net/pcb/pic18467.jpg
http://tumladen.net/pcb/pic26500.jpg

> Has anyone experienced the defects illustrated in the 4
> attached images? We are confident that these were properly
> tested at bare-board electrical test, and that these apparent
> opens must have completely separated later.
> Assemblies show some failures due to high-R at these kinds of
> defects (this one was a complete open).  We don't believe
> they were visible at AOI, but are attempting to replicate
> them and verify this.  We are guessing that a foil weakness
> existed at lamination, but failure did not occur until
> subsequent thermal or mechanical stress during assembly or in
> the field.
>
> Anyone have any thoughts?  Thanks very much.

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