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September 2007

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From:
Michael F Greaves <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Michael F Greaves <[log in to unmask]>
Date:
Wed, 12 Sep 2007 16:21:51 -0500
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Has anyone experienced the defects illustrated in the 4 attached images?
We are confident that these were properly tested at bare-board electrical
test, and that these apparent opens must have completely separated later.
Assemblies show some failures due to high-R at these kinds of defects (this
one was a complete open).  We don't believe they were visible at AOI, but
are attempting to replicate them and verify this.  We are guessing that a foil
weakness existed at lamination, but failure did not occur until subsequent
thermal or mechanical stress during assembly or in the field.

Anyone have any thoughts?  Thanks very much.



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