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August 2007

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Subject:
From:
"David D. Hillman" <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, [log in to unmask]
Date:
Tue, 14 Aug 2007 15:37:36 -0500
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Sheesh, just how much data do ya want? Shrinkage voids do NOT cause 
reliability issues. Incoming:

 - see page 873

 - see page 17

Dave



Jack Crawford <[log in to unmask]> 
Sent by: TechNet <[log in to unmask]>
08/14/2007 02:07 PM
Please respond to
TechNet E-Mail Forum <[log in to unmask]>; Please respond to
Jack Crawford <[log in to unmask]>


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Subject
[TN] Request for LF shrinkhole or hot tear failure data






Revision E work has begun on IPC-A-610 and J-STD-001. A-610D addressed hot 
tear/shrink hole in 5.2.11.  I believe that the original intent was 
specific to PTH connections, but as written, it can be applied to any LF 
connection (SMT, PTH or terminal soldering).

I've gathered a few comments--mostly questions--about failure mechanisms 
associated with hot tear. Several people claim evidence that hot tear 
cracks continue to propagate in the connections. 

Taking J001 and 610 literally, a fracture in a solder connection is a 
failure. A common sense approach to the criteria would only have a 
fracture to be a defect when it is in a critical area of a connection, but 
that determination may require more knowledge and experience than the 
typical user has.

610D provided for acceptance of hot tear/shrink holes only when the bottom 
of the tear is visible or the tear/shrink hole does not contact the lead, 
land or barrel wall. In response to a user's questions, Werner Engelmaier, 
Engelmaier Associates, L.C., provided some information (copied below) that 
suggests that even if the tear is at or propagates all the way to 
conductor, lead or barrel, whether the bottom is visible or not, it isn't 
likely to cause a failure of the connection.

My question to any of you is whether anyone can provide any evidence to 
the 610 committee of connection failures that can unquestionably be tied 
to a shrink hole or hot tear. Please don't reply standard improvement 
comments to this forum for discussion--that's the function of the 
committee and I may overlook the comment on the forum. Send them to me 
[log in to unmask]

This is also a great time to send me any other comments you have against 
610D, 001D, IPC-7711/21A or any other IPC document so the committees will 
have them at MidWest Expo Committee Meetings 
http://www.ipcmidwestshow.org/Std.aspx  I'll get your comments to the 
appropriate committee liaison.

Werner's comments to hot tear; some editing to remove personal 
discussions.

From: [log in to unmask]
Sent: Friday, March 24, 2006 8:15 AM
Subject: Re: Fillet tearing

The described issues-pad lifting, fillet lifting, fillet tearing [also 
called shrinkage fissures-are all caused by the same phenomenon. The 
combination of larger delta-T from solidification to RT, the higher 
strength of SAC-solders, faster cooling rates because of higher starting 
temperatures creating more cooling rate differences, more complex 
metallurgy, large differences in thermal mass, create stresses in the 
solder fillets that will cause the 'weakest link' to give. Sometimes the 
weakest link is the pad attachment to the resin matrix, in other cases the 
interfacial strength between IMC layers and Cu pad, in in others the 
solder volume itself.

Of course, none of these are pretty, but unfortunately, they are a 
characteristic of the LF-soldering realities.

From a purely reliability point of view, none of these pose a mechanical 
reliability problem, even long-term. These 'defects' do not pose a real 
latent conditions in terms of loss of functionality. 

I am more concerned with the possibility of corrosive damage, particularly 
in the cases of pad lifting and fillet lifting, less so with fillet 
tearing, because of the exposed Cu.

And I certainly would not make a differentiation between what is happening 
on the termination side vs. the component side as 610D does. That makes 
little reliability sense--if it is acceptable on one side, why not the 
other? That looks to me like simply calling it 'bad,' because on the 
tremination side you can see it and it is hidden on the component side.

As an example of a real reliability issue, I am much more concered with 
accepting a 75% hole fill, because the stress concentration posed by the 
partial fill can cause plated-through hole Cu barrel failure. 

##### 2nd message

My comments regarding the effect on reliability rests on the general 
situation, where through-hole leads exert virtually no loading on the SJs 
during operation--there are, as almost always exceptions. I certainly have 
seen PTH-leads that cyclically loaded pins/SJs to failure. The maximum 
loading condition is typically along the leads or at most 45 °away from 
the lead--thus, not really in line with the fractures.

Regards,
Werner Engelmaier
Engelmaier Associates, L.C.
Electronic Packaging, Interconnection and Reliability Consulting
7 Jasmine Run
Ormond Beach, FL 32174 USA
Phone: 386-437-8747, Fax: 386-437-8737, Cell: 386-316-5904
E-mail: [log in to unmask], Website: www.engelmaier.com 
#####

Jack Crawford, IOM
IPC Director Certification and Assembly Technology
[log in to unmask]
847-597-2893
FAX  847-615-5693
3000 Lakeside Drive, Suite 309 S
Bannockburn, IL, 60015

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