TECHNET Archives

June 2007

TechNet@IPC.ORG

Options: Use Monospaced Font
Show Text Part by Default
Show All Mail Headers

Message: [<< First] [< Prev] [Next >] [Last >>]
Topic: [<< First] [< Prev] [Next >] [Last >>]
Author: [<< First] [< Prev] [Next >] [Last >>]

Print Reply
Subject:
From:
Tina Nerad <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Tina Nerad <[log in to unmask]>
Date:
Tue, 19 Jun 2007 13:00:38 -0500
Content-Type:
text/plain
Parts/Attachments:
text/plain (1 lines)
Call for Participation

IPC/JEDEC Global Conference on Lead Free Reliability and Reliability Testing for RoHS Lead Free Electronics

October 4-5, 2007, Berlin, Germany

December 3-5, 2007, Austin, TX



IPC and JEDEC are seeking speakers to participate in these global conferences dedicated specifically to addressing the issues of reliability and reliability testing for lead free electronics.  Presentations are sought on any relevant subjects, including:  design for reliability, processing, reliability, and test.



Time slots between 30-45 minutes long will be available. To submit an abstract, please cut and paste www.ipc.org/LFGermany or www.ipc.org/LFTexas into your browser.  Please include an abstract of 200-300 words along with a brief biography of you, you may provide the same information via e-mail to [log in to unmask] The deadline for abstract submissions is:  Berlin, Germany - July 15, 2007 and 

Austin, Texas - August 31, 2007. Presentation materials must be non-commercial in nature, focusing on technology rather than a company’s product. 



EDUCATIONAL COURSES

Proposals are also solicited from individuals interested in teaching full-day tutorials (six hours) or half-day workshops (three hours) to a class of up to 30 persons on topics in these areas. An honorarium is offered to course instructors.


ATOM RSS1 RSS2