Rich- the paper you are looking for is:
A Critique of Ionic Contamination Testing for Surface Mount Technology, Gary
M. Knopeck and Dr. Kirk Bonner, Proceedings of the Technical Program, NEPCON
West 1988, pp 519-528.
I have the Proceedings from 1976 onward.
Bill Kenyon
Global Centre Consulting
3336 Birmingham Drive
Fort Collins, CO 80526
Tel: 970.207.9586 Cell: 970.980.6373
email [log in to unmask] (mailto:[log in to unmask])
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