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May 2007

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TechNet E-Mail Forum <[log in to unmask]>, [log in to unmask]
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Thu, 10 May 2007 16:09:57 EDT
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Rich- the paper you are looking for is:
 
A Critique of Ionic Contamination Testing for Surface Mount  Technology, Gary 
M. Knopeck and Dr. Kirk Bonner, Proceedings of the  Technical Program, NEPCON 
West 1988, pp 519-528.
 
I have the Proceedings from 1976 onward. 
 
Bill  Kenyon
Global Centre Consulting
3336 Birmingham Drive
Fort Collins, CO  80526
Tel: 970.207.9586   Cell: 970.980.6373
email [log in to unmask] (mailto:[log in to unmask]) 



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