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February 2007

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Subject:
From:
Tina Nerad <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Tina Nerad <[log in to unmask]>
Date:
Tue, 20 Feb 2007 08:03:45 -0600
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IPC/JEDEC announce the Lead Free Reliability and Reliability Testing for
RoHS Lead Free Electronics conference, being held April 10-12, 2007 at
the Courtyard Boston Tremont Hotel. This is your opportunity to further
your knowledge on what is at THE FOREFRONT of electronics!
This conference was designed to specifically address the challenges of
reliability and reliability testing for lead free electronics.
Among the leading reliability experts presenting at the technical
conference will be: Dr. David Pierce from Stanford University; Rainer
Dudek, Fraunhofer Institute IZM; Lunyu Ma, Intel Corporation; Robert
Kinyanjui, Sanmina-SCI Corporation; Isabel de Sousa, IBM Canada and
Wolfgang Biben, CenPra-Centro de Pesquisas Renato Archer.
Following the technical conference, we are also offering educational
courses on April 12, to provide in-depth information on the following
topics: lead free solder process, specifying PCBs for lead free
assembly, lead free reliability for harsh environment electronics and
understanding of the J-STD-020B and J-STD-033A documents. 
To register, please cut and paste the following into your browser:
www.ipc.org/LFReliability and download the registration form.

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