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December 2006

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Subject:
From:
Bev Christian <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Bev Christian <[log in to unmask]>
Date:
Mon, 18 Dec 2006 21:06:03 -0500
Content-Type:
text/plain
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text/plain (66 lines)
Wayne,
First, you mean electrochemical migration, not electromigration.  The
latter happens inside joints because of metal movement as a result of a
voltage potential and a high enough temperature.

Second, George Wenger and others at Lucent and people at Nortel (in
Harlow, England; RTP, North Carolina, USA and Belleville, Ontario,
Canada) did extensive studies on the stuff and didn't see issues.  And I
know Lucent used boatloads of the stuff (and maybe still do). I expect
George will weigh in after he does some reading of that link you kindly
provided.
Bev
RIM

-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Wayne Thayer
Sent: December 18, 2006 2:50 PM
To: [log in to unmask]
Subject: [TN] iNEMI Hi rel Pb-free finish report

In this report (dated 12/1/06) there are several cautions about
Immersion Ag due to electro-migration issues, particularly in sulfurous
environments.

I know that UL recently "de-criminalized" ImAg, primarily based on IPC
pressure.  Why hasn't iNEMI?

Can anybody recommend a paper which explains the severity of this
electro-migration issue with respect to ImAg?

Thanks,

Wayne Thayer

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