Hi Kevin,

I'm just asking the question. I have heard that a good benign no-clean
flux can give you some bogus readings using a ROSE test. 

Assume that it's not a big deal for a qualified no-clean to be on a
solder joint within a wound magnetic device. If you submerged the
assembly into the 75%/25% IPA/DI ROSE tester you could get a strange
reading from the magnetic device. You may get an abnormally high reading
that I don't believe would give you the ability to tell if the board
itself is really clean. Not only that but you really don't want to be
contaminating the filters in the ROSE tester with flux. It would shorten
their life and those puppies are expensive.

You could submerge the portion of the board that does not have the
magnetic device on it but that would get to be a pain in the butt also.

I'm just exploring options. Thanks for the suggestions and comments.
Anybody else?

KennyB


-----Original Message-----
From: Kevin Glidden [mailto:[log in to unmask]] 
Sent: Thursday, November 30, 2006 12:56 PM
To: 'TechNet E-Mail Forum'; Bloomquist, Ken
Subject: RE: [TN] Question about J-STD-001 cleanliness designator C-22

I guess I don't fully understand.  If you need to pass ionic cleanliness
testing, than you need to pass.  That includes the components used, not
just
the joints you made.  Ionics are detrimental on the PCB and on the
components- no discrimination there.  I would either pre-clean the
components or find different supplier.  If neither are feasible, you
would
need to do some sort of investigation with IC testing and/or SIR testing
to
prove the residues are not detrimental, wherever they may lie. Then if
validated by that testing, you could put in the documentation that the
P/F
limit is higher, just so long as you have the data behind it.  The
Rockwell
Gang or P.A.L pals might have a valid opinion here...

Kevin Glidden
Manufacturing Engineer
Astronics Luminescent Systems Inc.

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