TECHNET Archives

June 2006

TechNet@IPC.ORG

Options: Use Monospaced Font
Show Text Part by Default
Show All Mail Headers

Message: [<< First] [< Prev] [Next >] [Last >>]
Topic: [<< First] [< Prev] [Next >] [Last >>]
Author: [<< First] [< Prev] [Next >] [Last >>]

Print Reply
Subject:
From:
"Tempea, Ioan" <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Tempea, Ioan
Date:
Mon, 19 Jun 2006 07:47:57 -0400
Content-Type:
text/plain
Parts/Attachments:
text/plain (55 lines)
Inge,

this is very interesting! Would this equipment take care of the cracked BGA solder joints?

Thanks,

Ioan

-----Original Message-----
From: TechNet [mailto:[log in to unmask]]On Behalf Of Ingemar Hernefjord
(KC/EMW)
Sent: Monday, June 19, 2006 5:58 AM
To: [log in to unmask]
Subject: Re: [TN] Finding cracked capacitors


It may be a little late adding test methods, but I'm curious about what
the reaction will be on my proposal. Years ago, Yves Ousten, Institute
Polytechnic  Paris, gathered a number of guys from the universities and
the industry in order to find an acceptable way of finding defect
ceramic capacitors. He based his method on resonance ciruitry, where any
defect cap would deviate from a specified RF resonance signature. He
utilized the generation of elastic waves and piezoelectric effects,
microcracks having an essential influence on these parameters.  He has
written a lot about the test method, myself, I have just two reports:

"Improving Reliability of electronic assemblies using early physical and
electrical indicators."   and

"Non-destructive detection and localization of defects in multilayer
ceramic capacitors using electromechanical  resonances." 

"The use of Impedance Spectroscopy, SEM and SAM imaging for early
detection of failures in SMT assemblies."

It seems as the test method calls for skilled RF test engineer and quite
a expensive RF equiment. On the other hand, both these are available at
big companies. We were planning to use Ousten's method, but we have less
need nowadays, as microcracks are rather rare. 

Anyone who have used this capacitor test method?

Ingemar Hernefjord
Ericsson Microwave Systems

---------------------------------------------------
Technet Mail List provided as a service by IPC using LISTSERV 1.8e
To unsubscribe, send a message to [log in to unmask] with following text in
the BODY (NOT the subject field): SIGNOFF Technet
To temporarily halt or (re-start) delivery of Technet send e-mail to [log in to unmask]: SET Technet NOMAIL or (MAIL)
To receive ONE mailing per day of all the posts: send e-mail to [log in to unmask]: SET Technet Digest
Search the archives of previous posts at: http://listserv.ipc.org/archives
Please visit IPC web site http://www.ipc.org/contentpage.asp?Pageid=4.3.16 for additional information, or contact Keach Sasamori at [log in to unmask] or 847-615-7100 ext.2815
-----------------------------------------------------

ATOM RSS1 RSS2