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April 2006

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Subject:
From:
"Whittaker, Dewey (AZ75)" <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Whittaker, Dewey (AZ75)
Date:
Wed, 5 Apr 2006 13:46:21 -0700
Content-Type:
text/plain
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text/plain (48 lines)
At those voltages make sure the circuit design does not require a
tighter tolerance range and/or leakage rate than the part is capable of
achieving.
If you have isolated the failure mechanism to the surface trace/pad
spacing relationship and eliminated any internal ( barrel, ground/power
plane, trace ) concerns, then remove the cap and clean the area and
replace the cap. Take another one and remove the cap; clean the area
between and around the lands and hard-wire in the cap parallel to the
pads and retest. If this works than in the redesign: increase the
spacing; change the flux and cleaning process; and slot the spacing
between the lands.
Dewey

-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Andre Leclair
Sent: Wednesday, April 05, 2006 11:12 AM
To: [log in to unmask]
Subject: [TN] Arching or Current Leakage

We have a customer that has a portion of a circuit which randomly fails.
The circuit is a backlight driver (500volt 6mA). The output caps are
0.100 spacing of the terminals.  The process used is No-clean.  Can the
No-clean contribute to failures of the circuit (ie promote arching or
current leakage across the body of the output caps). ???

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