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April 2006

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Subject:
From:
Werner Engelmaier <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, [log in to unmask]
Date:
Fri, 14 Apr 2006 16:22:00 EDT
Content-Type:
text/plain
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text/plain (37 lines)
I wrote earlier:
 Hi Nill,
Could not locate a data sheet on Mitsubishi MOSFET RD07MVS1 at the given
website: http://www.mitsubishichips.com/Global/index.html.
Found a reliability section "III. FAILURE MECHANISMS OF SEMICONDUCTOR
DEVICES". However, this section does not give you much confidence. For one,
they use
Norris-Landzberg [many Japanese companies use it for some unfathonable
reason]
even so it has been clearly shown [by IBM no less shortly after the initial
Norris-Landzberg paper publication] that it does not work for solder, because
it cannot account for dwell time effects. For another, they report results
from
testing to low T-extremes from -40 to -100C [!?], and show failures as early
as 30 cycles [!?].
None of this gives me a warm, fuzzy feeling.
Werner

After seeing the data sheet at <http://tinyurl.com/fpgqa>, showing a ceramic
device dissipating 50 W, being ~6X5 mm in size , and having no provision for
solder attachment with any kind of compliancy, i not on have no 'warm, fuzzy
feeling', but a lump of ice in my stomach.
If you use this devicxe in an operating environment with some thermal cyclic
loading, you are assured premature SJ-failures.

Werner

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