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Date: | Mon, 24 Apr 2006 10:43:54 EDT |
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Hi Steven,
The only study that did this extensively is reported on in IPC-TR-579 —"Round
Robin Reliability Evaluation of Small Diameter Plated Through Holes in
Printed Wiring Boards." For the same delta-T, there is pretty good correspondence.
Also, for bare PCBs, it does not matter whether you change T's fast [T-shock]
or more slowly, since for a symmetrically built PCB T-gradients do not affect
the loading stresses [in contrast to assemblies].
Also, IPC-TR-486 —"Report on Round Robin Study to Correlate Interconnect
Stress Test (IST) with Thermal Stress/Microsectioning Evaluations for Detecting
the Presence of Inner-Layer Separations" provides good correlative information.
Werner
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