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Subject:
From:
Graham Naisbitt <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Graham Naisbitt <[log in to unmask]>
Date:
Mon, 13 Mar 2006 13:12:15 +0000
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Joyce

That is waaayyyy too sensible for a Friday!

I would like to run the same here and share the results...

...and oh boy., a challenge to SIR Doug: Whilst Doug is absolutely correct
that there are no prevailing standards or specifications, there are drafts
awaiting publication notably IEC - The International Electro-Technical
Commission INTERNATIONAL Standard IEC 61189-5. I can again send anyone a
copy if they let me know.

However, there is a huge amount of data published by the NPL and ourselves
that not only show where the present specs are suspect but, the EU Consortia
that included NPL, Siemens and NMRC ran a round-robin test programme showing
excellent correlation of data between their 3 sites using 3 different
measurement systems.

You would not be left "high and dry".

--
Regards Graham Naisbitt

[log in to unmask]

GEN3 SYSTEMS LIMITED (Formerly Concoat Systems)
Unit B2 Armstrong Mall
Southwood Business Park
Farnborough, Hampshire GU14 0NR

Phone: +44 (0)12 5252 1500
Fax: +44 (0)12 5252 1112

www.gen3systems.com




On 9/3/06 19:58, "Joyce Koo" <[log in to unmask]> wrote:

> Doug, Grraham and all other gurus, Many thanks for all your help.  I think I
> am going to test both...new and old...jk (zap, zap)
>
>
> -----Original Message-----
> From: TechNet [mailto:[log in to unmask]]On Behalf Of Douglas O. Pauls
> Sent: Thursday, March 09, 2006 9:15 AM
> To: [log in to unmask]
> Subject: Re: [TN] SIR spacing
>
>
> Joyce,
> For the new methods, it is not so much a case of obsolete or insufficient
> as they are not yet accepted, nor are any of the standards which call out
> such test methods revised to call out the new methods.  So, if you run the
> new test, you won't have criteria or a specification against which to test.
>
> Doug Pauls
>
>
>
>
>              Joyce Koo
>              <[log in to unmask]
>              COM>                                                       To
>              Sent by: TechNet          [log in to unmask]
>              <[log in to unmask]>                                          cc
>
>                                                                    Subject
>              03/09/2006 08:01          Re: [TN] SIR spacing
>              AM
>
>
>              Please respond to
>              [log in to unmask]
>                     om
>
>
>
>
>
>
> Excellent!  this is exactly what I am looking for.  Jack and Doug, is any
> possiblity to get access the proposed new test method as "review version"?
> Hate to run test ($$$) and find out it is "obsolete or insufficient" by
> gurus (never argue with someone that is superior than me either physically
> or mentally..;-)
>
>                                           jk
> ps: Doug, you are right, Sandia is a brickwall..either by phone or e-mail..
> I guess they finger it out I do not have million $s just look at the phone
> number..;-(
>
> -----Original Message-----
> From: TechNet [mailto:[log in to unmask]]On Behalf Of Graham Naisbitt
> Sent: Thursday, March 09, 2006 6:21 AM
> To: [log in to unmask]
> Subject: Re: [TN] SIR spacing
>
>
> Hi Joyce
>
> There is a new IPC-TM-650 2.6.3.7 spec due to be released soon that
> introduces a far more relevant test protocol to help characterise a process
> rather than a single material (e.g. Flux).
>
> This includes a recommended bias of 5v based upon a gradient of 25v/mm. The
> reason for this is based upon science research led by the NPL that showed
> lower voltage actually increased the effects of electro-chemical migration.
>
> The measurement voltage is also recommended to be at 5v with no reverse
> bias.
>
> The purpose is to try and test under conditions that most accurately
> reflect
> what your product is doing in real life.
>
> Testing using the old standards may well yield unrealistic results. As a
> further example, no-clean fluxes tested at 85/85 would be volatilised off
> the surface at this elevated temperature. New recommendations now under
> consideration are to test no-cleans at 40C/93RH - that way we can better
> see
> if there are any ECM issues.
>
> The dielectric withstand in CC-830 requires the coating to be tested to
> TM-650 2.5.7.1 and "there shall be no disruptive discharge evidenced by
> flash-over (surface discharge), sparkover (air discharge) or breakdown
> (puncture discharge). The leakage rate shall not exceed 10 microamperes."
>
> I hope this helps
>
> --
> Regards Graham Naisbitt
>
> [log in to unmask]
>
> GEN3 SYSTEMS LIMITED (Formerly Concoat Systems)
> Unit B2 Armstrong Mall
> Southwood Business Park
> Farnborough, Hampshire GU14 0NR
>
> Phone: +44 (0)12 5252 1500
> Fax: +44 (0)12 5252 1112
>
> www.gen3systems.com
>
>
>
>
> On 8/3/06 19:49, "Joyce Koo" <[log in to unmask]> wrote:
>
>> Dear SIR,
>> could you kindly provide the update info regarding the maximum bias for
> the
>> conformal coating SIR test?  Is it still 333 V/mm?  assume I use read out
> at
>> 100 Vdc and bias at 50 Vdc for the B-25A, am I right that bias max is
>> 333V/mm and read out is at 666V/mm spacing?  Thank you very much.
>> Best regards,
>>                        jk
>> ps.  I know Concoat recommend low voltage bias, but the current test
> method
>> 650-2.6.3.4 is still high voltage.  (50Vdc bias)... by the way, anyone
> has
>> table regarding the dielectric withstanding voltage per IPC-CC-830?  Many
>> thanks.)
>>
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