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January 2006

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Subject:
From:
"Tempea, Ioan" <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Tempea, Ioan
Date:
Fri, 6 Jan 2006 09:39:21 -0500
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Hi Netters,

we've just become the happy owners of a tabletop XRF analyzer. Works fine, shows what we need, we have already rejected non-compliant parts, etc.

But there is a litle something... The soft allows for creating applications, so we can declare that the component has layers, i.e. you can define Au over Ni over Cu. At this moment the measurements will tell you what is the thickness of each layer and what is the composition of each layer. Normally this increases the accuracy of the measurements.

If I x-ray considering layers, I get readings for a SnPb layer that show 14% lead. If I don't use the layered routine and I shoot through the bulk of the surface, the Pb goes away, the influence of the Ni and mainly of the Cu dilutes the Pb to below RoHS threshold.

Hence the question, how should I measure? What is the homogeneous material, each layer or the bulk?

Thanks,
Ioan

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