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January 2006

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Subject:
From:
Michael McMonagle <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Michael McMonagle <[log in to unmask]>
Date:
Tue, 31 Jan 2006 10:46:28 -0600
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I have been thrown an interesting question that I cannot answer, so I'll
toss it out here for y'all to ponder. We are looking for a way to measure
the thickness of gold and photoresist on a ceramic substrate. The test needs
to be non-destructive for use as an in-process production test, measuring
gold in the range of 5 microns covered with photoresist in the range of 3-6
microns. Any inputs greatly appreciated, thanks..

 

Mike McMonagle
Quality Manager
OYO Geospace
7007 Pinemont Drive
Houston, TX 77040
Ph 713-986-8650
Fx 713-986-8725

 


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