Those capabilities are common to most fluoroscopes actually. The XRF's have
a function for providing a spectrum, or spectrum analysis of the specimen
tested.
Most XRF equipment can provide a visual representation of the level or
amount of the element detected, you've probably seen similar screen images
on shows like CSI where a sample is placed in a chamber and the screen shows
spiked charts, while in CSI they are probably using an SEM or AA it is the
same visual depiction.
Franklin
-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Sara Rice
Sent: Friday, January 06, 2006 12:41 PM
To: [log in to unmask]
Subject: Re: [TN] How to use XRF?
Here is a link to an article that I read recently in US Tech about an XRF
system made by Fischer Technology - sounds rather interesting in its
capability to distinguish layers and composition - do any of you have
experience with this system, or any feedback about it?
http://www.us-tech.com/np/ustech/files/guestD1573535530A.html
Sara Rice
Foresite Inc.
1982 S. Elizabeth St.
Kokomo, IN 46902
(765)457-8095
www.residues.com
-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Kane, Amol (349)
Sent: Friday, January 06, 2006 1:23 PM
To: [log in to unmask]
Subject: Re: [TN] How to use XRF?
Hi, on a related note...we are looking for a XRF too... can you share the
manufacturer's details and pricing on the XRF you have??
Amol Kane
M.S (Industrial Eng.)
Process Engineer
Harvard Custom Manufacturing
941 Route 38 Owego, NY 13827
Phone: (607) 687-7669 x349
[log in to unmask]
-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Tempea, Ioan
Sent: Friday, January 06, 2006 9:39 AM
To: [log in to unmask]
Subject: [TN] How to use XRF?
Hi Netters,
we've just become the happy owners of a tabletop XRF analyzer. Works fine,
shows what we need, we have already rejected non-compliant parts, etc.
But there is a litle something... The soft allows for creating applications,
so we can declare that the component has layers, i.e. you can define Au over
Ni over Cu. At this moment the measurements will tell you what is the
thickness of each layer and what is the composition of each layer. Normally
this increases the accuracy of the measurements.
If I x-ray considering layers, I get readings for a SnPb layer that show 14%
lead. If I don't use the layered routine and I shoot through the bulk of the
surface, the Pb goes away, the influence of the Ni and mainly of the Cu
dilutes the Pb to below RoHS threshold.
Hence the question, how should I measure? What is the homogeneous material,
each layer or the bulk?
Thanks,
Ioan
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