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Date: | Tue, 31 Jan 2006 10:12:09 -0700 |
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I believe you could measure both with XRF if provided the correct standards.
At 09:46 AM 01/31/2006, you wrote:
>I have been thrown an interesting question that I cannot answer, so I'll
>toss it out here for y'all to ponder. We are looking for a way to measure
>the thickness of gold and photoresist on a ceramic substrate. The test needs
>to be non-destructive for use as an in-process production test, measuring
>gold in the range of 5 microns covered with photoresist in the range of 3-6
>microns. Any inputs greatly appreciated, thanks..
>
>
>
>Mike McMonagle
>Quality Manager
>OYO Geospace
>7007 Pinemont Drive
>Houston, TX 77040
>Ph 713-986-8650
>Fx 713-986-8725
>
>
>
>
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