There can be a significant difference in the results presented by the
instruments in question. Case in point, is that I have compared results
from a Omegameter 600SMD (static system) versus an Ionograph 500M SMD
(dynamic & heated). On the same type of assemblies I have gotten a 3.5
times higher contamination rate on the 500M SMD.
The calibration solution is primarily for a one point calibration, used
to confirm where the manufacturer believes that one point should be at.
When you add features such as heating, and dynamic solution cleaning you
can get quit a noticeable difference in results, especially if you are
using a set time for the test. At one time the EMPF did some work where
they were developing correlation factors compared to the MIL P-28809 (?)
manual (beaker & wash bottle) method. Those tests seem to end with the
EMPF so in actuality I think they only ran ~ 3-4 systems.
These ROSE tests are only really useful to monitor an established
process. They are not really meant to qualify a product for use. I seem
to remember this more or less stated in some IPC document (HDBK-001?).
Hope we get some more conversation going on this point as I too would
like to find a way to better correlate these results from different
instruments.
Rich K/KEDS
-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Joe Russeau
Sent: Wednesday, October 26, 2005 10:21 AM
To: [log in to unmask]
Subject: Re: [TN] Omegameter to IPC-TM-650, Method 2.3.25 cross
reference
Hi Joe,
I have reviewed rev D of J-STD-001 (don't have Rev C), in section
8.3.6.3,
it says "for assemblies soldered with ROL0 or ROL1 fluxes, the surface
contamination shall be less than 1.56 micrograms per square centimeter
NaCl
(approximately 10 micrograms / sq. in) equivalent ionic or ionizable
flux
residue". I do not see in the Rev D version ( I would assume it is
similar
in the Rev C) where a particular piece of equipment is specified. Thus,
I
would conclude that adjustments to that value are not warranted, unless
you
and your customer have agrred to a different value. I will grant you
that
not all pieces of equipment measure the same on all occassions ( too
many
variables to discuss, perhaps another discussion), but the Omegameters I
have worked with have standardizing solutions that can be purcahsed.
Standardizing the machine before testing to make sure it is measuring
correctly is always a good practice, but changing the recommended value
just
because you are using an Omegameter instead of an Ionograph, not enough
justification for me. My 2 cents.
Best Regards,
Joe Russeau
Process Analyst
Precision Analytical Laboratory, Inc.
4106 Cartwright Dr. Ste. A
Kokomo, IN 46902
P: 765-455-1993
F: 765-455-1996
E: [log in to unmask]
----- Original Message -----
From: "Macko, Joe @ IEC" <[log in to unmask]>
To: <[log in to unmask]>
Sent: Wednesday, October 26, 2005 9:27 AM
Subject: [TN] Omegameter to IPC-TM-650, Method 2.3.25 cross reference
> Fellow techs,
>
>
>
> Good morning.
>
> We have an Omegameter 600SMD that is used to check boards for ionic
> contaminates. The ionic residue limit within J-STD-001C, para. 8.3.6
is
10
> ug/sq. NaCl. Some personnel believe that this number should be
adjusted
> based on the actual instrument used (e.g., an Omegameter). Would
someone
be
> so kind as to comment on this subject and what the correct limit is
for an
> Omegameter type of instrument.
>
>
>
> Thanks
>
> joe
>
>
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