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Subject:
From:
Dwight Mattix <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Dwight Mattix <[log in to unmask]>
Date:
Wed, 19 Oct 2005 11:32:29 -0700
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At 08:47 AM 10/19/2005, Karl Sauter wrote:
>Dwight,
>
>How is heat to get from the device to the thermal via if you don't plate
>over it?


The via is plated, yes?
The via is connected to the surface copper at the knee of the hole, yes?
The thermal path is down through the knee of the hole into the via, yes?
Any plating over the via fill is a small to insignificant part of the total
% surface copper and therefore a small part of the thermal path into the
via, no?

Been there, done that, got the T-shirt.  It works.

(warning Will Robinson) When using thermal via farms, you may find any
solution is so effective at conducting heat into the pwb that without a
thoroughly dried pwb, and a carefully controlled preheat/ramp the pwb will
be sensitive/prone to delam in those areas anyway.  The risk is accentuated
when there's a high % of gnd fill on inner layers in the area.  These via
farms w/ gnd fill is really good at passing heat into the pwb fast and
creating an unintentional thermal shock effect.

The delam risk is ESPECIALLY high in this type via cluster when uVia
buildup layers are needed. Of course the uVia probably means use of single
ply dielectrics over buried via subassemblies.  In those cases the plating
thickness on the sub needs to be minimized (more is definitely not better),
the buried vias need to be prefilled w/ resin to prevent local resin
starvation in the single ply layers.  Otherwise, the single ply will have
to stick to tall copper and do it w/out all the necessary resin (avoid 106
in this case and use at least a 1080).

that's $.04 from me today.  Still free and worth every penny.  :^)

cheers,
dw




>  Agree that CTE of the non-conductive fill must be a very close match.
>
>Regards,
>Karl Sauter, Sun Microsystems
>
>
>Dwight Mattix wrote:
>>We have a lot of experience w/ this type failure.  I'm working on the
>>assumption that there's a thermal via farm in that center gnd slug area.
>>A couple recommendations ff the cuff...
>>    * Stay away from conductive via fill material whenever possible when
>>vias are tightly packed in "thermal via farms."   Conductive fill is almost
>>never needed -- adds very little actual thermal/conductive benefit. We've
>>modeled it and test it.  For my money, conductive fill is almost always a
>>waste of time and a real pain in the patootie from reliability standpoint.
>>The biggest benefit is that it's easier to plate over and get good copper
>>adhesion and that usually only matters on probe sites. Esp
>>evil/unpredictable in this application is CB100 (I've had lots of dialogue
>>w/ Dupont over the years on this type failure).
>>    * Use a non-conductive fill that's more closely matched in CTE (e.g.San
>>eh) and don't overplate the fill.
>>    * Arguably the most significant factor:  don't plate over the thermal
>>vias.  All overplating does is give the fill something to push against and
>>force the whole plated area up during thermal excursions. It's like
>>screwing a cylinder head on tightly and then pushing all the pistons up
>>against it (expanding fill at temp).  Pop goes the weasel!  Overplating
>>doesn't add any grounding or thermal benefit. The solder joint in the gnd
>>slug will still be fine w/ the dot pattern that emerges.
>>    * As a work around/mod: We've eliminated a couple of these problems on
>>finished product by just etching or laser ablating a dot of copper off over
>>the fill.
>>there's my $.02.  Free and worth every penny.  ;^)
>>cheers,
>>dw
>>At 07:29 AM 10/19/2005, Steve Gregory wrote:
>>
>>>Hi Wee Mei!
>>>
>>>I've got your pictures posted. Go to:
>>>
>>>http://www.stevezeva.homestead.com/files/U2_top.JPG
>>>http://www.stevezeva.homestead.com/files/U2_bottom.JPG
>>>http://www.stevezeva.homestead.com/files/U2_delamination.JPG
>>>
>>>Are the vias filled? Are you seeing this delamination on very many
>>>PCB's? Are you seeing it only on the bottom of the PCB?
>>>
>>>Kind regards,
>>>
>>>-Steve Gregory-
>>>Senior Process Engineer
>>>LaBarge Incorporated
>>>Tulsa, Oklahoma
>>>(918) 459-2285
>>>(918) 459-2350 FAX
>>>
>>>
>>>
>>>|---------+---------------------------->
>>>|         |           Wee Mei          |
>>>|         |           <[log in to unmask]
>>>|         |           SG>              |
>>>|         |           Sent by: TechNet |
>>>|         |           <[log in to unmask]>|
>>>|         |                            |
>>>|         |                            |
>>>|         |           10/19/2005 03:47 |
>>>|         |           AM               |
>>>|         |           Please respond to|
>>>|         |           TechNet E-Mail   |
>>>|         |           Forum            |
>>>|         |           <[log in to unmask]>|
>>>|         |           ; Please respond |
>>>|         |           to Wee Mei       |
>>>|         |           <[log in to unmask]
>>>|         |           SG>              |
>>>|         |                            |
>>>|---------+---------------------------->
>>>
>>>
>>>  >--------------------------------------------------------------------------------------------------------------|
>>>
>>>   |
>>>                                         |
>>>   |       To:       [log in to unmask]@SMTP@Exchange
>>>                                         |
>>>   |       cc:       (bcc: Stephen R
>>>Gregory/LABARGE)
>>>
>>>|
>>>   |       Subject:  [TN] Delamination at Thermal Via
>>>area?                                                       |
>>>
>>>
>>>  >--------------------------------------------------------------------------------------------------------------|
>>>
>>>
>>>
>>>
>>>Hello,
>>>
>>>Just asked Steve to download 3 pictures on the defects. Kindly take a look
>>>at them and would appreciate some feedback on the possible root cause.
>>>
>>>Steve : Thanks for the downloading.
>>>
>>>Regards,
>>>Wee Mei
>>>
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