Michel
Call Steve Boggs at Celestica in Toronto. He may be able to help. I am not able to find his phone number.
Best regards
Lee
J. Lee Parker, Ph.D.
JLP Consultants LLC
804 779 3389
----- Original Message -----
From: Arbour, Michel<mailto:[log in to unmask]>
To: [log in to unmask]<mailto:[log in to unmask]>
Sent: Wednesday, September 21, 2005 12:32 PM
Subject: Re: [TN] ENIG contaminant : Auger analysis recommended ?
We have a quote at $1000Can at MuAnalysis in Ontario. I find this a bit
pricey but if it is what it takes to nail down the issue then go for it....
If someones knows an alternative source with a good track record for this
type of analysis testing in Canada... , pls let me know.
Thanks for your help
Michel
-----Original Message-----
From: John Parsons [mailto:[log in to unmask]]
Sent: Wednesday, September 21, 2005 11:36 AM
To: [log in to unmask]<mailto:[log in to unmask]>
Subject: Re: [TN] ENIG contaminant : Auger analysis recommended ?
Can anyone recommend any test labs in Canada or US capable of this type of
analysis?
John Parsons
-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Lee parker
Sent: Tuesday, September 20, 2005 7:31 PM
To: [log in to unmask]<mailto:[log in to unmask]>
Subject: Re: [TN] ENIG contaminant : Auger analysis recommended ?
Michel
Those who are familiar with Auger will tell you it is the method of choice
for surface analysis. It only penetrates angstroms into the surface and you
can sputter a controlled depth into the surface. The only issue I have ever
encountered is the operator; you need an expert to operate the machine and
interpret the results.
Best regards
Lee
J. Lee Parker, Ph.D.
JLP Consultants LLC
804 779 3389
----- Original Message -----
From: Arbour, Michel<mailto:[log in to unmask]<mailto:[log in to unmask]>>
To: [log in to unmask]<mailto:[log in to unmask]<mailto:[log in to unmask]<mailto:[log in to unmask]>>
Sent: Tuesday, September 20, 2005 5:11 PM
Subject: [TN] ENIG contaminant : Auger analysis recommended ?
Hi
We will be sending non solderable PCB for analysis. Goal is to detect
black
nickel, black pad, soldermask contamination before plating or other
contaminant. Is Auger analysis with ion sputtering (SAM) an effective
method
to determine the contaminants. Is this method proven and accepted in the
PCB
industry for this task ?
Michel Arbour
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