Colleagues:
Please plan to join our Subcommittee Co-Chairs, Jan Obrzut and Robert
Croswell, and participate in putting
on the finishing touches to the attached Test Method 2.5.7.2, Draft 3.
While the full document is subject to
comment, it is anticipated that the majority of our discussions will
occur from section 3 to the end.
The specifics for the D-54 Embedded Devices Test Methods Subcommittee
Teleconference are as follows:
Date: Thursday, August 11, 2005
Time: 3:00 - 4:00 pm CDT
Call-In #: 1-620-584-8200; PIN: 89542#
Tom Newton