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August 2005

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Subject:
From:
Joe Fjelstad <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, [log in to unmask]
Date:
Thu, 4 Aug 2005 11:40:30 EDT
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In a message dated 8/3/2005 11:21:06 PM Pacific Daylight Time, 
[log in to unmask] writes:
Would US affect the peel strength of very fine tracks (<100 µm)? 

Good question, Brian. 

Lower profile copper treatments are generally required for finer features. 

It would seem then, by extension, that terminations on a BGA package 
substrate be similarly vulnerable. 

(I read and understand that it was manifest only on PCB substrates and only 
of BGA land patterns. Is this correct?) 

Some more questions (perhaps already asked by investigators) Was there a 
pattern or tendancy to the failures in terms of physical location? was it random? 
Was it BGAs of all I/O counts or specific ones? Plastic or Cermaic? Where 
there differences between different pitches?

An interesting engineering forensics problem...  

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