Hi Techies
I have the ideal solution - use Hubble!
Sorry, couldn't resist as I presently in India (Chennai or Madras in old
money) and needed some light relief.
More serious though, aren't microscopes in use to detect solder balls - and
to count them as part of the PPM count? Can't remember the mag level though
Graham Naisbitt - man its warm over here.....
On 12/7/05 13:58, "Douglas O. Pauls" <[log in to unmask]> wrote:
> I KNEW I should have trademarked that phrase!!
>
> The background for my question is that we have a customer, with zero
> manufacturing experience, looking at one of our assemblies and seeing
> something I call water staining (from our aqueous wash process). You have
> to look at 30-50X to see the residues. They have convinced themselves that
> this is "contamination" and are all fluttery over the issue. I have tried
> to point out that this is a normal artifact of the aqueous process, it is
> not a problem, and that if you look close enough, you can find something
> wrong with any electronic assembly, or if you look close enough, you can
> see some visual aspect you don't understand and convince yourself you have
> a problem.
>
> Yes, there is another background problem I am working to solve, but it has
> nothing to do with this issue and I am trying to move the customer focus
> where it should be. I wanted some kind of sanity check on how closely
> other peoples specifications say you inspect.
>
> Doug Pauls
>
>
>
>
> "Bev Christian"
> <[log in to unmask]
> om> To
> "TechNet E-Mail Forum"
> 07/12/2005 06:55 <[log in to unmask]>,
> AM <[log in to unmask]>
> cc
>
> Subject
> RE: [TN] Mag level
>
>
>
>
>
>
>
>
>
>
> Doug,
> It depends - I could not resist! :)
>
> Seriously, that is my answer. I mean, are you talking about inspection
> on the shop floor by an inspector or are you talking about trying to
> solve a problem? The IPC specs set a standard for "normal" inspection,
> but one could argue that inspecting for residue could be considered
> abnormal. We have used our microscope on our FTIR and between using it
> by itself and the infrared spectrum obtained through the microscope we
> have been able to nab a supplier for leaving flux residue in a
> connector.
> Bev
> RIM
> -----Original Message-----
> From: TechNet [mailto:[log in to unmask]] On Behalf Of Douglas O. Pauls
> Sent: July 11, 2005 5:39 PM
> To: [log in to unmask]
> Subject: Re: [TN] Mag level
>
> And your proposed amended magnification level is........?
>
> Doug Pauls
>
>
>
>
> "Whittaker, Dewey
> (AZ75)"
> <Dewey.Whittaker@
> To
> HONEYWELL.COM> [log in to unmask]
> Sent by: TechNet
> cc
> <[log in to unmask]>
>
> Subject
> Re: [TN] Mag level
> 07/11/2005 04:29
> PM
>
>
> Please respond to
> TechNet E-Mail
> Forum
> <[log in to unmask]>
> ; Please respond
> to
> "Whittaker, Dewey
> (AZ75)"
> <Dewey.Whittaker@
> HONEYWELL.COM>
>
>
>
>
>
>
> Sir Doug,
> What we have now in IPC-6012 is insufficient. I am writing a proposal to
> amend IPC-6012 and one of the things is to use Table 1-2 of IPC-A-610
> for
> visual inspection magnification requirements.
> Dewey
>
> -----Original Message-----
> From: TechNet [mailto:[log in to unmask]] On Behalf Of Douglas O. Pauls
> Sent: Monday, July 11, 2005 2:14 PM
> To: [log in to unmask]
> Subject: [TN] Mag level
>
> Good afternoon all.
>
> A question about proper magnification for inspection. When you inspect
> a
> printed wiring assembly, what magnification (typical and maximum) to you
> use
> when looking for visible residues (e.g. flux residues)?
>
> Doug Pauls
> Rockwell Collins
>
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