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Subject:
From:
Jerry Dengler <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Jerry Dengler <[log in to unmask]>
Date:
Tue, 12 Jul 2005 09:09:33 -0400
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The smallest features we inspect are 0.020" so we stick with Table 1-2 out of IPC-A-610 and use 10X on the floor.  

Jerry Dengler
Manufacturing Engineer
Pergamon Corporation



-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Douglas O. Pauls
Sent: Tuesday, July 12, 2005 8:59 AM
To: [log in to unmask]
Subject: Re: [TN] Mag level

I KNEW I should have trademarked that phrase!!

The background for my question is that we have a customer, with zero manufacturing experience, looking at one of our assemblies and seeing something I call water staining (from our aqueous wash process).  You have to look at 30-50X to see the residues.  They have convinced themselves that this is "contamination" and are all fluttery over the issue.  I have tried to point out that this is a normal artifact of the aqueous process, it is not a problem, and that if you look close enough, you can find something wrong with any electronic assembly, or if you look close enough, you can see some visual aspect you don't understand and convince yourself you have a problem.

Yes, there is another background problem I am working to solve, but it has nothing to do with this issue and I am trying to move the customer focus where it should be.  I wanted some kind of sanity check on how closely other peoples specifications say you inspect.

Doug Pauls




             "Bev Christian"
             <[log in to unmask]
             om>                                                        To
                                       "TechNet E-Mail Forum"
             07/12/2005 06:55          <[log in to unmask]>,
             AM                        <[log in to unmask]>
                                                                        cc

                                                                   Subject
                                       RE: [TN] Mag level










Doug,
It depends - I could not resist!  :)

Seriously, that is my answer.  I mean, are you talking about inspection on the shop floor by an inspector or are you talking about trying to solve a problem?  The IPC specs set a standard for "normal" inspection, but one could argue that inspecting for residue could be considered
abnormal.   We have used our microscope on our FTIR and between using it
by itself and the infrared spectrum obtained through the microscope we have been able to nab a supplier for leaving flux residue in a connector.
Bev
RIM
-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Douglas O. Pauls
Sent: July 11, 2005 5:39 PM
To: [log in to unmask]
Subject: Re: [TN] Mag level

And your proposed amended magnification level is........?

Doug Pauls




             "Whittaker, Dewey
             (AZ75)"
             <Dewey.Whittaker@
To
             HONEYWELL.COM>            [log in to unmask]
             Sent by: TechNet
cc
             <[log in to unmask]>

Subject
                                       Re: [TN] Mag level
             07/11/2005 04:29
             PM


             Please respond to
              TechNet E-Mail
                   Forum
             <[log in to unmask]>
             ; Please respond
                    to
             "Whittaker, Dewey
                  (AZ75)"
             <Dewey.Whittaker@
              HONEYWELL.COM>






Sir Doug,
What we have now in IPC-6012 is insufficient. I am writing a proposal to amend IPC-6012 and one of the things is to use Table 1-2 of IPC-A-610 for visual inspection magnification requirements.
Dewey

-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Douglas O. Pauls
Sent: Monday, July 11, 2005 2:14 PM
To: [log in to unmask]
Subject: [TN] Mag level

Good afternoon all.

A question about proper magnification for inspection.  When you inspect a printed wiring assembly, what magnification (typical and maximum) to you use when looking for visible residues (e.g. flux residues)?

Doug Pauls
Rockwell Collins

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