D-52 Embedded Devices Test Methods Subcommittee
Co-Chairs:
Jan Obrzut, NIST
Robert Croswell, Motorola
MINUTES - Teleconference on Thursday, July 14, 2005 at 4:00 - 5:00 pm
EDT
Telecon Participants:
John Andresakis, Oak Mitsui
David McGregor, E.I. du Pont de Nemours & Co.
G. Sidney Cox, E.I. du Pont de Nemours & Co.
Nick Biunno, Sanmina-SCI
Greg Schroeder, Sanmina-SCI
Dave Corbett, DSCC
Two Other Gentlemen from DSCC
Jan Obrzut, NIST
Robert Croswell, Motorola
Tom Newton, IPC
The teleconference addressed the Draft 2 of the proposed Test Method
2.5.7.2.
Please find the attached Compiled Comments on Draft 2 of TM 2.5.7.2 and,
through
incorporation of the resolved comments during the 7-14-05
teleconference, a Draft 3
of TM 2.5.7.2 was constructed and attached, as well.
Note: The two attachments will be inserted into the D-54 Subcommittee
Home Page
in the 'Drafts' and 'Comments' sections on Monday, August 1.
Thomas D. Newton
Director PCB Programs, Standards and Technology
IPC - Association Connecting Electronics Industries
3000 Lakeside Drive; Suite 309-S
Bannockburn, IL 60015
Direct: 847-597-2849 Main: 847-615-7100
Fax: 847-615-7105
E-mail: [log in to unmask] web: www.ipc.org
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