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June 2005

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Subject:
From:
Jeffrey Bush <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Jeffrey Bush <[log in to unmask]>
Date:
Thu, 30 Jun 2005 10:43:10 -0400
Content-Type:
text/plain
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text/plain (68 lines)
If the part is Class 2, the via should have trace intersect reliability
as well as connection to 270 degrees of the feed-through.  Damage to the
pad that does not violate these parameters should be a defendable
position.

Jeffrey Bush
Director, Quality Assurance and Technical Support

VERMONT CIRCUITS INCORPORATED
  76 Technology Drive - POB 1890
    Brattleboro, Vermont 05302
      Voice: 802.257.4571.21 Fax: 802.257.0011
           http://www.vtcircuits.com
 
-----Original Message-----
From: Mary Jane Chism [mailto:[log in to unmask]] 
Sent: Thursday, June 30, 2005 10:25 AM
To: [log in to unmask]
Subject: [TN] Via holes damaged

Group,
 
I have a question on via holes damaged by test probes.  We have a
situation where some of the annular ring of the vias used for test
points are being damaged.  I have looked in the IPC-A-610 Rev. D and
also IPC-A-600 Rev. G, but am not finding what I need or am not looking
in the right place.  If anyone knows of the requirements of what is
acceptable or a defect for this type of condition, please let me know.
 
Thanks.
 
Mary Jane 
 
Mary Jane Chism
Technical Trainer/ Learning Center
Kimball Electronics Group
email: [log in to unmask] <mailto:[log in to unmask]> 
Phone: 812-634-4462
Fax:     812-634-4501
 

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