What are you considering damage?

If the probe is merely indenting the metal this may not be considered
'damage'.

If the probe is piercing the finish, exposing copper then inspect it
according to exposed copper, if it is exposing glass, inspect it to exposed
glass, if it is lifting the pad, inspect to lifted pads, if it is damaging
the hole wall, copper separation, reduced hole size, etc etc etc then
inspect to such.

Franklin

-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Mary Jane Chism
Sent: Thursday, June 30, 2005 9:25 AM
To: [log in to unmask]
Subject: [TN] Via holes damaged

Group,

I have a question on via holes damaged by test probes.  We have a
situation where some of the annular ring of the vias used for test
points are being damaged.  I have looked in the IPC-A-610 Rev. D and
also IPC-A-600 Rev. G, but am not finding what I need or am not looking
in the right place.  If anyone knows of the requirements of what is
acceptable or a defect for this type of condition, please let me know.

Thanks.

Mary Jane

Mary Jane Chism
Technical Trainer/ Learning Center
Kimball Electronics Group
email: [log in to unmask] <mailto:[log in to unmask]>
Phone: 812-634-4462
Fax:     812-634-4501


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