Group,
I have a question on via holes damaged by test probes. We have a
situation where some of the annular ring of the vias used for test
points are being damaged. I have looked in the IPC-A-610 Rev. D and
also IPC-A-600 Rev. G, but am not finding what I need or am not looking
in the right place. If anyone knows of the requirements of what is
acceptable or a defect for this type of condition, please let me know.
Thanks.
Mary Jane
Mary Jane Chism
Technical Trainer/ Learning Center
Kimball Electronics Group
email: [log in to unmask] <mailto:[log in to unmask]>
Phone: 812-634-4462
Fax: 812-634-4501
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