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May 2005

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Subject:
From:
Bev Christian <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Bev Christian <[log in to unmask]>
Date:
Fri, 6 May 2005 08:05:26 -0400
Content-Type:
text/plain
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text/plain (69 lines)
Werner,
I was not a member of the committee during those discussions.  However,
if a company has a library of completed testing using the data loggers
and they that a product tested to X number of cycles which they know by
experience will be equivalent to more than the life of their expected
product, shouldn't that be good enough?  Or better yet, they have run
experiments with both data loggers and event detectors and have
correlated the results?

Probably the main reasons people use data loggers over event detectors
are:
1) data loggers are easy to come by - more people sell them
2) event detectors are SO finicky when it comes to glitches . You
practically have to ground your grandmother three countries away to not
have spurious signals.  

Regards,
Bev
RIM

-----Original Message-----
From: TechNet [mailto:[log in to unmask]] On Behalf Of Werner Engelmaier
Sent: May 5, 2005 11:50 PM
To: [log in to unmask]
Subject: Re: [TN] IPC 9701 Failure Definition

Hi,
Yes youn are correct. HOWEVER, I have a real problem with the use of
data loggers for finding solder joint reliability. They have been shown
to miss failures for many thousands of cycles after the fracture
actually occurred. I strongly advise against the use of data loggers [
they arew o.k. for bare board testing] for solder joint reliability
testing. Their inclusion in IPC-9701 was against my advice and against
all my experience.
Werner Engelmaier

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