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April 2005

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Subject:
From:
Vladimir Igoshev <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Vladimir Igoshev <[log in to unmask]>
Date:
Mon, 25 Apr 2005 14:56:17 -0400
Content-Type:
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Hello Victor,

I use 1 micron diamond suspension (for a "final touch") and it has always worked for me.

Vladimir

Vladimir Igoshev, Ph. D.
Senior Materials Researcher
Research in Motion
451 Phillip St.
Waterloo, ON, N2L 3X2

Voice: (+1) 519-888-7465, ext. 5283
Fax: (+1) 519-886-0863
E-mail: [log in to unmask]


-----Original Message-----
From: TechNet [mailto:[log in to unmask]]On Behalf Of Victor G. Hernandez
Sent: Monday, April 25, 2005 2:48 PM
To: [log in to unmask]
Subject: [TN] Lead Free, Ball Grid Array, solder bump cross section


Fellow TechNetters:

   I have conducted many of LF solder bump cross section and final
polish is conducted with a Buehler Masterprep

Polishing Suspension Alumina 0.05 microns.   Micro craves, epoxy
shrinkage/voids, on the sample surface retain

the polishing compound which contaminate the surface appearance.   This
step can cause staining and/or water

marks on the bulb solder prior to mid range magnification examination
with inverted stage microscope.

   Can some one recommend a LF chemical etchant that I can replace the
alumina step in my process? 

Victor,

 


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