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March 2005

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Subject:
From:
Kerry Bode <[log in to unmask]>
Reply To:
TechNet E-Mail Forum <[log in to unmask]>, Kerry Bode <[log in to unmask]>
Date:
Fri, 4 Mar 2005 08:50:28 -0600
Content-Type:
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As stated in IPC-6012 A section: 4.2.2 Referee Test: “Two additional micro-
section sets from the same panel may be prepared and evaluated for micro-
section defects that are considered to be isolated or random in nature or
caused by micro-section preparation. For acceptance, both referee sets
must be defect free”   What is the interpretation of “Two additional micro-
section sets”? Is it limited to the micro-section plating structure in
which the defect was detected. My thoughts are based upon IPC-6012A Table
4-3 Acceptance Testing and Frequency. The table identifies the frequency
of micro-section evaluation based on PWB designs with a signal plating
structure. Does this table represent a micro-section set. As noted in. IPC-
6012A section 3.6 Structural Integrity states “Blind and Buried vias shall
meet the requirements of plated-through holes.” This sentence requires
redeployment of table 4-3 for each additional plating structure within the
PWB as a set.

For example: If a micro-section evaluation revealed low copper in one of
the 9 different plating structure it would be have no bearing on the other
8 plating structures. The referee sections would only be relevant to the
set structure the defect was detected in. The example can be applied to
many attributes; however in each case the deficiency must be isolated or
random. With that said: What is the interpretation of micro-section set?


Thanks
Kerry

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