Andrew, it has been a few years since I've looked into this, but a standard
aging test for semiconductors was the so called 85/85 - 85 C and 85% for
1000 hours.  IBM had some PCB aging tests, the details of which I forget,
that involved cycling humidity and temperature over a period of some weeks,
while monitoring the resistance between conductive traces, internal and
external.  10+ years ago Wayne Nelson published a handbook of accelerated
life testing.  The last I heard, the main interest was in HAST and HALT
testing, Highly Accelerated Stress and Life.  Some models had been worked up
by researchers.  A fundamental question to ask is what materials are you
testing and what failure mechanisms are you concerned about?  Lou Hart

-----Original Message-----
From: TechNet [mailto:[log in to unmask]]On Behalf Of Andrew Medina
Sent: Wednesday, March 24, 2004 8:39 AM
To: [log in to unmask]
Subject: [TN] ACCELERATED AGING TEST
Importance: High

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