Thanks for the e-mails that I received on this topic some weeks back
(see original e-mail listed below). 
 
I was able to determine that 2 specifications seem to address the
concept of measuring discrete particulate matter on a PWB assembly,
namely Mil STD 1246C and its replacement which seems to be IEST CC1246.
Both documents seem to be directed towards clean rooms but do seem
potentially have relevance for electronics assemblies. As I have yet to
obtain these documents I'm somewhat in the dark as to their specific
details. Problem I have with J-STD -001 is that it doesn't provide any
methodology to quantify the results.
 
Does anyone have any expertise or experience with either Mil STD 1246C
or IEST CC1246?
 
 

Rich Kraszewski 

Advanced Manufacturing Engineer - KEDS

Phone:  812.634.4281

Pager:  812.481.3492

 

 

-----Original Message-----
From: Richard Kraszewski 
Sent: Monday, January 12, 2004 8:26 AM
To: [log in to unmask]
Subject: J-Stnd-001 Section 8.31 (Particulate Matter)


I'm seeking input on how organizations confirm that they meet the
requirements of J-Stnd-001, section  8.31 for particulate matter? I
image that one could collect a sample (somehow?) and inspect under
magnification, but I'm looking for specific methods & their details. It
sure would be nice to identify a method that would actually have a
chance of passing an MSE.
 
Any thoughts?
 
Rich Kraszewski 
Advanced Manufacturing Engineer - KEDS
1038 E. 15th Street, Jasper, IN 47546
Phone:  812.634.4281
Pager:  812.481.3492
E-mail:  [log in to unmask]
 
 
 
 
 

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