LEADFREE Archives

August 2003

Leadfree@IPC.ORG

Options: Use Monospaced Font
Show Text Part by Default
Show All Mail Headers

Message: [<< First] [< Prev] [Next >] [Last >>]
Topic: [<< First] [< Prev] [Next >] [Last >>]
Author: [<< First] [< Prev] [Next >] [Last >>]

Print Reply
Subject:
From:
MA/NY DDave <[log in to unmask]>
Reply To:
(Leadfree Electronics Assembly Forum)
Date:
Wed, 13 Aug 2003 19:03:00 -0500
Content-Type:
text/plain
Parts/Attachments:
text/plain (26 lines)
Hi Guenter, and IPC-LF Listservers,

In the Solder Joint Reliability tread Jean noted he has read that
SnAgCu (SAC) can have a higher creep rate than SnPb (Sn63Pb37),
or as I have sometimes seen in EU notes 63Sn37Pb, at higher stress
levels. I am a bit doubtful that we could see SnPb being higher in
creep rate at lower stresses and then SAC all of a sudden becoming
higher. My only thought is that the researchers made some mistake
like comparing pre-yield point SnAgCu to post-yield point SnPb.

SO

What do you think about this report that showed at higher stresses
that SnAgCu had a higher creep rate than SnPb.

YiEngr, MA/NY DDave

-------------------------------------------------------------------------------Leadfee Mail List provided as a free service by IPC using LISTSERV 1.8d
To unsubscribe, send a message to [log in to unmask] with following text in
the BODY (NOT the subject field): SIGNOFF Leadfree
To temporarily stop delivery of Leadree for vacation breaks send: SET Leadfree NOMAIL
Search previous postings at: http://listserv.ipc.org/archives
Please visit IPC web site http://www.ipc.org/html/forum.htm for additional
information, or contact Keach Sasamori at [log in to unmask] or 847-509-9700 ext.5315
-------------------------------------------------------------------------------

ATOM RSS1 RSS2