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August 2003

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Subject:
Re: Capacitors and lead-free
From:
MA/NY DDave <[log in to unmask]>
Reply To:
(Leadfree Electronics Assembly Forum)
Date:
Tue, 12 Aug 2003 10:31:03 -0500
Content-Type:
text/plain
Parts/Attachments:
text/plain (30 lines) 
Hi Joe, and LF Listservers,

I wonder if under this subject WernerE and other long term Reliability
Engr's thoughts touched on the wide ATC temperature range used for some
of these ATC tests. Potentially the range that it used for SnPb is
causing a false field accelerated failure for LeadFree.

Werner noted some of this under the ATC note series when he noted that
you should have a dwell and a smaller range when performing ATC tests.

Please add to your thoughts on why Moisture might be causing a
particular problem with certain capacitors.

Do you think that the failure might be independent of LeadFree
Material Properties??

Are your thoughts that the Reflow Temperature alone is causing
an internal construction problem??

YiEngr, MA/NY DDave

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