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July 2003

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Subject:
From:
Brian Ellis <[log in to unmask]>
Reply To:
TechNet E-Mail Forum.
Date:
Tue, 15 Jul 2003 18:33:49 +0300
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  The use of Ionic contamination testing for "no-clean" fluxes is
meaningless, except in terms of ensuring that a process is constant. The
absolute value as measured by an instrument under given conditions must
be considered as arbitrary. On the other hand, this statement does not
apply to cleaned boards where the measured residues may be considered as
being related to the reliability of the finished article. This subject
has been battered around on this forum so many times that I am surprised
that the whole world is not aware of it. :-)

If you wish more details, may I respectfully suggest  that you do a
search within the forum archives, where you'll find at least 100 posts!

Brian

Ken Patel wrote:
> Does NO Clean processed parts show more ionic contamination than aqueous
> processed parts when measured using ionograph? We are seeing third party
> part showing 50 plus microgram of NaCl per square inch. Is there a different
> ionograph measurement standard for No clean v/s aqueous washed (9.67
> microgram of NaCl per square inch)? Is there an IPC/industry spec for No
> clean processed parts?
>
> Re,
> Ken Patel
>
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