Paul,

Others will no doubt respond with many details, but the short answer is
yes; IST was developed to test PWBs, has been thorougly modeled and been
benchmarked to other standard stress tests. Within Sanmina-SCI you have
resident experts in the Owego PCB facility. It is a versatile test which
can determine process or product effects on via/PTH lifetime.

Valerie






                      Paul Signorelli
                      <Paul.Signorelli@SANMI         To:      [log in to unmask]
                      NA-SCI.COM>                    cc:
                      Sent by: TechNet               Subject: [TN] Interconnect Stress Testing
                      <[log in to unmask]
                      ORG>


                      07/10/2003 10:56 AM
                      Please respond to
                      "TechNet E-Mail
                      Forum."; Please
                      respond to Paul
                      Signorelli






Has anyone done any Interconnect Stress Testing on PWB's ?

There is an article by Ron Carter (Alion Science & Technology Corp) in
The Journal of the Reliability Analysis Center, this month (Second
Quarter).
and a history at  http://www.pwbcorp.com or
http://www.pwbcorp.com/FrameDoc.html

It is a highly accelerated  test using special coupons and high current
trace/PTH heating with forced air cooling.

My question is: Is this test a predictor of long term reliability and
within the design limits of a PWB
or is it just a method to find exceptionally good PWB's that exceed
design requirements ?

HALT and HASS can be designed to operate parts above rated limits and
precipitate 'failures' that are just parametric failures because the
test exceeds the manufacturers rating. (That is a process of finding the
better parts by operating them above their design limits).


Paul Signorelli

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